1
Aleksandar Uzelac, David A Stevens, Weidong Zhao, Takahiro Shigemitsu, Briggs A Willoughby, John Graham Pierce, Pravin Kumar Santiago, Craig S Ranta, Timothy Allen Wright, Jeffrey C Maier, Robert T Perry, Stanimir Naskov Kirilov: Latency measurement. Microsoft Corporation, Tony Azure, Andrew Sanders, Micky Minhas, May 13, 2014: US08725443 (13 worldwide citation)

Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different te ...


2
Aleksandar Uzelac, David A Stevens, Weidong Zhao, Takahiro Shigemitsu, Briggs A Willoughby, John Graham Pierce: Touchscreen testing. Microsoft Technology Licensing, Timothy Churna, Kate Drakos, Micky Minhas, March 24, 2015: US08988087 (9 worldwide citation)

Touchscreen testing techniques are described. In one or more implementations, a conductor is placed proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user by placing the conductor in a grounded state and lack of a touch by the user by placing the conduc ...


3
Aleksandar Uzelac, David A Stevens, Weidong Zhao, Takahiro Shigemitsu, Briggs A Willoughby, John Graham Pierce, Pravin Kumar Santiago, Craig S Ranta, Timothy Allen Wright, Jeffrey C Maier, Robert T Perry, Stanimir Naskov Kirilov, Andrey B Batchvarov: Probabilistic latency modeling. Microsoft Technology Licensing, Timothy Churna, Kate Drakos, Micky Minhas, May 12, 2015: US09030437 (6 worldwide citation)

Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different te ...


4
Aleksandar Uzelac, David A Stevens, Weidong Zhao, Takahiro Shigemitsu, Briggs A Willoughby, John Graham Pierce, Pravin Kumar Santiago, Craig S Ranta, Timothy Allen Wright, Jeffrey C Maier, Robert T Perry, Stanimir Naskov Kirilov, Andrey B Batchvarov: Probabilistic latency modeling. Microsoft Technology Licensing, Timothy Churna, Sergey Lamansky, Micky Minhas, July 19, 2016: US09395845 (3 worldwide citation)

Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different te ...


5
Aleksandar Uzelac, David A Stevens, Weidong Zhao, Takahiro Shigemitsu, Briggs A Willoughby, John Graham Pierce: Touchscreen testing. MICROSOFT TECHNOLOGY LICENSING, July 18, 2017: US09710105 (2 worldwide citation)

Touchscreen testing techniques are described. In one or more implementations, a conductor is placed proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user by placing the conductor in a grounded state and lack of a touch by the user by placing the conduc ...


6
Aleksandar Uzelac, Andrey B Batchvarov: Acoustic touch sensitive testing. MICROSOFT TECHNOLOGY LICENSING, October 10, 2017: US09785281

Acoustic touch sensitive testing techniques are described. In one or more implementations, a touch-sensitive surface of a touch-sensitive device is tested by detecting contact made with the touch sensitive surface using an acoustic sensor and comparing data describing the contact that is received fr ...


7
Aleksandar Uzelac, David A Stevens, Weidong Zhao, Takahiro Shigemitsu, Briggs A Willoughby, John Graham Pierce, Pravin Kumar Santiago, Craig S Ranta, Timothy Allen Wright, Jeffrey C Maier, Robert T Perry, Stanimir Naskov Kirilov: Contact geometry tests. MICROSOFT TECHNOLOGY LICENSING, May 8, 2018: US09965094

Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different te ...


8
Aleksandar Uzelac, David A Stevens, Weidong Zhao, Takahiro Shigemitsu, Briggs A Willoughby, John Graham Pierce, Pravin Kumar Santiago, Craig S Ranta, Timothy Allen Wright, Jeffrey C Maier, Robert T Perry, Stanimir Naskov Kirilov, Andrey B Batchvarov: Probabilistic Latency Modeling. Microsoft Corporation, July 26, 2012: US20120188197-A1

Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different te ...


9
Aleksandar Uzelac, David A Stevens, Weidong Zhao, Takahiro Shigemitsu, Briggs A Willoughby, John Graham Pierce, Pravin Kumar Santiago, Craig S Ranta, Timothy Allen Wright, Jeffrey C Maier, Robert T Perry, Stanimir Naskov Kirilov: Contact Geometry Tests. Microsoft Corporation, July 26, 2012: US20120188176-A1

Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different te ...


10
Aleksandar Uzelac, David A Stevens, Weidong Zhao, Takahiro Shigemitsu, Briggs A Willoughby, John Graham Pierce, Pravin Kumar Santiago, Craig S Ranta, Timothy Allen Wright, Jeffrey C Maier, Robert T Perry, Stanimir Naskov Kirilov: Latency Measurement. Microsoft Corporation, July 26, 2012: US20120191394-A1

Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different te ...