1
Peter J Pupalaikis, Kaviyesh Doshi, Roger Delbue, Anirudh Sureka: Time domain network analyzer. Teledyne LeCroy, Andrew Dommer, June 14, 2016: US09366743 (72 worldwide citation)

An apparatus for measuring s-parameters using as few as one pulser and two samplers is described. The apparatus calibrates itself automatically using the internal calibration standards.


2
Clifford W Meyers, John K Doughty: Electrical network modeling tool and analyzer. Raytheon Company, Leonard A Alkov, Glenn H Lenzen Jr, August 11, 1998: US05794008 (6 worldwide citation)

A low cost electrical network analyzer that provides waveform predictions in the time domain of a device for any electrical signal stimuli and with any load. In a preferred embodiment, input, output and stimulating source waveform recorders are used to record tables of time domain data (voltage wave ...


3
Peter J Pupalaikis, Kaviyesh Doshi, Roger Delbue, Anirudh Sureka: Time domain network analyzer. Teledyne LeCroy, Gordon Kessler, April 22, 2014: US08706438

An apparatus for measuring s-parameters using as few as one pulser and two samplers is described. The apparatus calibrates itself automatically using the internal calibration standards.


4
Peter J Pupalaikis, Kaviyesh Doshi, Anirudh Sureka: Time domain reflectometry step to S-parameter conversion. Teledyne LeCroy, Gordon Kessler, April 22, 2014: US08706433

A method and apparatus are provided for calculating s-parameters of a device under test from step waveforms acquired by a time domain network analyzer.


5
Peter J Pupalaikis, Kaviyesh Doshi, Anirudh Sureka: Time domain reflectometry step to s-parameter conversion. LeCroy Corporation, August 4, 2011: US20110191046-A1

A method and apparatus are provided for calculating s-parameters of a device under test from step waveforms acquired by a time domain network analyzer.


6
Peter J Pupalaikis, Kaviyesh Doshi, Roger Delbue, Anirudh Sureka: Time domain network analyzer. LeCroy Corporation, August 4, 2011: US20110191054-A1

An apparatus for measuring s-parameters using as few as one pulser and two samplers is described. The apparatus calibrates itself automatically using the internal calibration standards.


7
Time Domain Reflectometry Step to S-Parameter Conversion. Teledyne LeCroy, April 10, 2014: US20140098848-A1

A method and apparatus are provided for calculating s-parameters of a device under test from step waveforms acquired by a time domain network analyzer.


8
Time Domain Network Analyzer. Teledyne LeCroy, June 26, 2014: US20140176156-A1

An apparatus for measuring s-parameters using as few as one pulser and two samplers is described. The apparatus calibrates itself automatically using the internal calibration standards.


9
TIME DOMAIN REFLECTOMETRY STEP TO S-PARAMETER CONVERSION. July 27, 2017: US20170214476-A1

A method and apparatus are provided for calculating s-parameters of a device under test from step waveforms acquired by a time domain network analyzer.