1
Campbell Richard: A test structure and probe for differential signals. Cascade Microtech, Campbell Richard, RUSSELL Kevin L, December 21, 2007: WO/2007/145728 (27 worldwide citation)

A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.


2
Richard Campbell: Test structure and probe for differential signals. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, July 22, 2008: US07403028 (26 worldwide citation)

A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.


3
Richard Campbell: Test structure and probe for differential signals. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, July 6, 2010: US07750652 (7 worldwide citation)

A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.


4
Richard Campbell: Test structure and probe for differential signals. Cascade Microtech, Chernoff Vilhauer Mcclung & Stenzel, October 9, 2008: US20080246498-A1

A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.


5
Richard Campbell: Test structure and probe for differential signals. Cascade Microtech, Chernoff Vilhauer Mcclung & Stenzel, December 13, 2007: US20070285111-A1

A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.


6
Richard Campbell: Test structure and probe for differential signals. Cascade Microtech, Chernoff Vilhauer Mcclung & Stenzel, September 30, 2010: US20100244874-A1

A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.