1
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. SanDisk Corporation, Majestic Parsons Siebert & Hsue, August 12, 1997: US05657332 (492 worldwide citation)

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


2
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. SanDisk Corporation, Majestic Parsons Siebert & Hsue, July 2, 1996: US05532962 (400 worldwide citation)

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


3
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. Zilog, Majestic Parsons Siebert & Hsue, April 11, 2000: US06049899 (41 worldwide citation)

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


4
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. SanDisk Corporation, Davis Wright Tremaine, November 10, 2009: US07616484 (31 worldwide citation)

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


5
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. SanDisk Corporation, Davis Wright Tremaine, November 23, 2010: US07839685 (13 worldwide citation)

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


6
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. SanDisk Corporation, Davis Wright Tremaine, October 14, 2008: US07437631 (4 worldwide citation)

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


7
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. SanDisk Corporation, Davis Wright Tremaine, June 16, 2009: US07548461

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


8
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. Parsons Hsue & de Runtz, November 25, 2004: US20040237010-A1

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


9
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in eeprom devices. Parsons Hsue & de Runtz, March 17, 2005: US20050058008-A1

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


10
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft Errors Handling in EEPROM Devices. Davis Wright Tremaine Sandisk Corporation, January 28, 2010: US20100020616-A1

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...