1
K Reed Gleason, Tim Lesher, Mike Andrews, John Martin: Shielded probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, September 18, 2007: US07271603 (36 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe measurement system preferably includes a probe having a conductive path extending between the first and second surfaces of a membrane and a p ...


2
K Reed Gleason, Tim Lesher, Mike Andrews, John Martin: Shielded probe for testing a device under test. Sharp Laboratories of America, Chernoff Vilhauer McClung & Stenzel, June 6, 2006: US07057404 (22 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe measurement system preferably includes a probe having a conductive path between the first and second sides of a substrate and a probe contact ...


3
K Reed Gleason, Tim Lesher, Mike Andrews, John Martin: Shielded probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, March 10, 2009: US07501842 (6 worldwide citation)

A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and ...


4
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Shielded probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, April 14, 2009: US07518387 (5 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.


5
K Reed Gleason, Tim Lesher, Mike Andrews, John Martin: Shielded probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, March 3, 2009: US07498829 (5 worldwide citation)

A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and ...


6
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Shielded probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, January 27, 2009: US07482823 (5 worldwide citation)

A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and ...


7
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Shielded probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, February 10, 2009: US07489149 (4 worldwide citation)

A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal oath and ...