1
Victor B Kley: Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images. General Nanotechnology, Townsend and Townsend and Crew, May 15, 2001: US06232597 (76 worldwide citation)

A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.


2
Vic B Kley: Scanning probe microscope assembly and method for making confocal, spectrophotometric, Near-Field, and Scanning probe measurements and associated images. General Nanotechnology L L C, Flehr Hohbach Test Albritton & Herbert, November 7, 2000: US06144028 (56 worldwide citation)

A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.


3
Vic B Kley: Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images. General Nanotechnology L L C, Townsend and Townsend and Crew, February 4, 2003: US06515277 (33 worldwide citation)

A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.


4
Vic B Kley: Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images. General Neontechnology, Townsend and Townsend and Crew, May 8, 2001: US06229138 (32 worldwide citation)

A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.


5
Vic B Kley: Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images. General Nanotechnology, Townsend and Townsend and Crew, August 28, 2001: US06281491 (31 worldwide citation)

A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.


6
Victor B Kley: Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images. General Nanotechnology, Townsend and Townsend and Crew, June 5, 2001: US06242734 (29 worldwide citation)

A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.


7
Vic B Kley: Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images. General Nanotechnology, Townsend and Townsend and Crew, May 28, 2002: US06396054 (28 worldwide citation)

A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.


8
Vic B Kley: Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images. General Nanotechnology, Townsend and Townsend and Crew, April 9, 2002: US06369379 (26 worldwide citation)

A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.


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Methods and Apparatus for Nanolapping. August 10, 2017: US20170225290-A9

A lapping system for lapping portions of a workpiece. The lapping system includes, a lap that is defined by a surface. Portions of the surface are a lapping surface. The lapping surface has a coating that enhances material removal from a workpiece in a lapping process. The lapping system further inc ...