1
January Kister: Probes with offset arm and suspension structure. MicroProbe, Deborah A Peacock, Samantha A Updegraff, Peacock Myers P C, June 19, 2012: US08203353 (4 worldwide citation)

A probe having a conductive body and a contacting tip that is terminated by one or more blunt skates for engaging a conductive pad of a device under test (DUT) for performing electrical testing. The contacting tip has a certain width and the blunt skate is narrower than the tip width. The skate is a ...


2
January Kister: Probes with offset arm and suspension structure. FormFactor, Peacock Myers P C, Deborah A Peacock, Philip D Askenazy, September 1, 2015: US09121868 (4 worldwide citation)

A probe having a conductive body and a contacting tip that is terminated by one or more blunt skates for engaging a conductive pad of a device under test (DUT) for performing electrical testing. The contacting tip has a certain width and the blunt skate is narrower than the tip width. The skate is a ...


3
January Kister: Probes with offset arm and suspension structure. MicroProbe, Peacock Myers PC, November 18, 2010: US20100289512-A1

A probe having a conductive body and a contacting tip that is terminated by one or more blunt skates for engaging a conductive pad of a device under test (DUT) for performing electrical testing. The contacting tip has a certain width and the blunt skate is narrower than the tip width. The skate is a ...


4
January Kister: Probes with offset arm and suspension structure. Microprobe, December 13, 2012: US20120313660-A1

A probe having a conductive body and a contacting tip that is terminated by one or more blunt skates for engaging a conductive pad of a device under test (DUT) for performing electrical testing. The contacting tip has a certain width and the blunt skate is narrower than the tip width. The skate is a ...