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John Dunklee, Clarence E Cowan: Probe station with low inductance path. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, July 31, 2007: US07250779 (26 worldwide citation)

A probe assembly suitable for making test measurements using test signals having high currents. The disclosed probe assembly provides for a test signal exhibiting relatively low inductance when compared to existing probe assemblies by preferably reducing the electrical path distance between the test ...


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Dunklee John, Cowan Clarence E: Probe station with low inductance path. Cascade Microtech, August 31, 2005: EP1567871-A2

A probe assembly suitable for high-current measurements of an electrical device.


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John Dunklee, Clarence E Cowan: Probe station with low inductance path. Chernoff Vilhauer McClung & Stenzel, May 12, 2005: US20050099192-A1

A probe assembly suitable for high-current measurements of an electrical device.


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John Dunklee, Clarence E Cowan: Probe station with low inductance path. Chernoff Vilhauer Mcclung & Stenzel, October 25, 2007: US20070247178-A1

A probe assembly suitable for high-current measurements of an electrical device.


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Dunklee John, Cowan Clarence E: Probe station with low inductance path. Cascade Microtech, August 30, 2005: KR1020057009430

A probe assembly suitable for high- current measurements of an electrical device.