1
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, March 26, 2002: US06362636 (50 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


2
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, October 28, 2003: US06639415 (49 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


3
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, December 3, 2002: US06489789 (49 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


4
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, January 11, 2005: US06842024 (47 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


5
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, December 1, 2009: US07626379 (21 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


6
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, March 13, 2007: US07190181 (8 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


7
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, October 14, 2008: US07436170 (3 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


8
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, July 31, 2007: US07250752 (3 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


9
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Chernoff Vilhauer Mcclung & Stenzel, March 24, 2005: US20050062489-A1

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


10
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Chernoff Vilhauer Mcclung & Stenzel, November 30, 2006: US20060267610-A1

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...