1
January Kister: Probe cards employing probes having retaining portions for potting in a potting region. Astria Semiconductor Holdings, Deborah A Peacock, Samantha A Updegraff, Peacock Myers P C, August 31, 2010: US07786740 (19 worldwide citation)

Method and apparatus using a retention arrangement for probes used for electrical testing of a device under test (DUT). The apparatus has a number of probes each of which has a connect end for applying a test signal, a retaining portion, at least one arm portion and a contact tip for making an elect ...


2
January Kister: Probe cards employing probes having retaining portions for potting in a potting region. Lumen Patent Firm, April 17, 2008: US20080088327-A1

Method and apparatus using a retention arrangement for probes used for electrical testing of a device under test (DUT). The apparatus has a number of probes each of which has a connect end for applying a test signal, a retaining portion, at least one arm portion and a contact tip for making an elect ...


3
Kister January: Probe cards employing probes having retaining portions for potting in a potting region. Microprobe, Kister January, JACOBS Ron, April 17, 2008: WO/2008/045225

Method and apparatus using a retention arrangement for probes used for electrical testing of a device under test (DUT). The apparatus (10) has a number of probes (16) each of which has a connect end for applying a test signal, a retaining portion (20A), at least one arm portion and a contact tip for ...