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Anatoly Kotlarsky, Xiaoxun Zhu, Michael Veksland, Ka Man Au, Patrick Giordano, Weizhen Yan, Jie Ren, Taylor Smith, Michael V Miraglia, C Harry Knowles, Sudhin Mandal, Shawn De Foney, Christopher Allen, David M Wilz Sr: Optical scanning system having an extended programming mode and method of unlocking restricted extended classes of features and functionalities embodied therewithin. Metrologic Instruments, Thomas J Perkowski Esq P C, November 27, 2012: US08317105 (210 worldwide citation)

A method of unlocking restricted extended classes of features and functionalities embodied within an optical scanning system having an extended programming mode. The method involves providing an optical scanning system supporting baseline classes of features and functionalities, and having an extend ...


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Anatoly Kotlarsky, Xiaoxun Zhu, Michael Veksland, Ka Man Au, Patrick Giordano, Weizhen Yan, Jie Ren, Taylor Smith, Michael V Miraglia, C Harry Knowles, Sudhin Mandal, Shawn De Foney, Christopher Allen, David M Wilz SR: Optical scanning system having an extended programming mode and method of unlocking restricted extended classes of features and functionalities embodied therewithin. Metrologic Instruments, April 26, 2012: US20120097743-A1

A method of unlocking restricted extended classes of features and functionalities embodied within an optical scanning system having an extended programming mode. The method involves providing an optical scanning system supporting baseline classes of features and functionalities, and having an extend ...