1
Andrew P Sabersky, Nicholas Littlestone, Jack E Abbott, William J Gibbons, Robert R D Orazio, Nathan R Smith: Non-contact high resolution displacement measurement technique. Micro Component Technology, Fliesler Dubb Meyer & Lovejoy, May 2, 1989: US04827436 (24 worldwide citation)

Apparatus is disclosed for optically detecting the position of an edge of a workpiece (such as an IC lead tip) in a sensing plane, involving the emission of electromagnetic energy from a known source region in the sensing plane such as to cause the edge to create a shadow having a penumbra in the se ...


2
Sabersky Andrew P, Littlestone Nicholas, Abbott Jack E, Gibbons William J, D Orazio Robert R J, Smith Nathan R: Non-contact high resolution displacement measurement technique. Mct Synerception, FLIESLER Martin C, November 3, 1988: WO/1988/008512

An apparatus for optically detecting the position of an edge (114) of a workpiece in a sensing plane (110), involving the emission of electromagnetic energy from a known source region (100) in the sensing plane (110) such as to cause the edge (114) to create a shadow having a penumbra in the sensing ...