61
Vic B Kley: Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images. General Nanotechnology, Townsend and Townsend and Crew, April 9, 2002: US06369379 (25 worldwide citation)

A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.


62
Tapesh Yadav: Nanoparticles of rare earth oxides. PPG Industries Ohio, March 3, 2009: US07498005 (24 worldwide citation)

Rare earth compositions comprising nanoparticles are described along with various nanotechnology applications of such nanoparticles. The compositions of the nanomaterials discussed may include scandium (Sc), yttrium (Y), lanthanum (La), cerium (Ce), praseodymium (Pr), neodymium (Nd), promethium (Pm) ...


63
Tapesh Yadav, Karl Pfaffenbach: Nano-engineered phosphors and related nanotechnology. NanoProducts Corporation, Stuart T Langley, Hogan & Hartson, April 27, 2004: US06726992 (24 worldwide citation)

Dispersed phosphor powders are disclosed that comprise nanoscale powders dispersed on coarser carrier powders. The composition of the dispersed fine powders may be oxides, carbides, nitrides, borides, chalcogenides, metals, and alloys. Such powders are useful in various applications such as lamps, c ...


64
Victor B Kley: Scanning probe microscopy inspection and modification system. General Nanotechnology, Townsend and Townsend and Crew, May 16, 2006: US07045780 (23 worldwide citation)

A scanning probe microscopy (SPM) inspection and/or modification system which uses SPM technology and techniques. The system includes various types of microstructured SPM probes for inspection and/or modification of the object. The components of the SPM system include microstructured calibration str ...


65
Alex Nugent: Universal logic gate utilizing nanotechnology. Knowmtech, Kermit D Lopez, Luis M Ortiz, Ortiz & Lopez PLLC, September 2, 2008: US07420396 (22 worldwide citation)

A universal logic gate apparatus is disclosed, which include a plurality of self-assembling chains of nanoparticles having a plurality of resistive connections, wherein the plurality of self-assembling chains of nanoparticles comprise resistive connects utilized to create a universal, reconfigurable ...


66
Tapesh Yadav: Titanium comprising nanoparticles and related nanotechnology. NanoProducts Corporation, Foley & Lardner, June 19, 2007: US07232556 (21 worldwide citation)

Nanoparticles comprising titanium, such as nanoscale doped titanium metal compounds, inorganic titanium compounds, and organic titanium compounds, their methods of manufacture, and methods of preparation of products from nanoparticles comprising titanium are provided.


67
Bernard J Eastlund: Method and apparatus for a large volume plasma processor that can utilize any feedstock material. May 20, 1997: US05630880 (21 worldwide citation)

This invention utilizes a large volume plasma processor to completely ionize any feedstock material and deposit the ionized and unionized species of elements of the feedstock material on deposition stages. Apparatus is provided for generating a toroidal, high temperature, low density plasma in the l ...


68
Hidekazu Suzuki, Atsushi Uemoto: Scanning charged particle microscope. SII NanoTechnology, Adams & Wilks, February 8, 2005: US06852973 (21 worldwide citation)

The present invention sets out to provide a scanning charged particle microscope equipped with a rapid control function capable of extrapolating an in-focus point from image information for a single frame and an automatic focusing system capable of reliably and precisely carrying out a focusing oper ...


69
Alex Nugent: Multilayer training in a physical neural network formed utilizing nanotechnology. KnowmTech, Kermit D Lopez, Luis M Ortiz, Ortiz & Lopez PLLC, July 6, 2010: US07752151 (20 worldwide citation)

A method for and system for training a connection network located between neuron layers within a multi-layer physical neural network. A multi-layer physical neural network can be formed having a plurality of inputs and a plurality outputs thereof, wherein the multi-layer physical neural network comp ...


70
Victor B Kley: Scanning probe microscopy inspection and modification system. General Nanotechnology, Townsend and Townsend and Crew, March 1, 2005: US06861648 (20 worldwide citation)

A scanning probe microscopy (SPM) inspection and/or modification system which uses SPM technology and techniques. The system includes various types of microstructured SPM probes for inspection and/or modification of the object. The components of the SPM system include microstructured calibration str ...