101
Haruo Takahashi, Toshiaki Fujii, Yutaka Ikku, Kouji Iwasaki, Yo Yamamoto: Charged particle beam apparatus. SII Nanotechnology, Adams & Wilks, October 28, 2008: US07442942 (13 worldwide citation)

To include a focused ion beam apparatus fabricating a sliced specimen by processing a specimen as well as observing the sliced specimen, a scanning electron microscope observing the slice specimen, a gas-ion beam irradiation apparatus performing finishing processing by irradiating a gas-ion beam ont ...


102
Alex Nugent: Hierarchical temporal memory utilizing nanotechnology. Knowm Tech, Kermit D Lopez, Luis M Ortiz, Ortiz & Lopez PLLC, April 19, 2011: US07930257 (12 worldwide citation)

Methods and systems are presented for constructing biological-scale hierarchically structured cortical statistical memory systems using currently available fabrication technology and meta-stable switching devices. Learning content-addressable memory and statistical random access memory circuits are ...


103
Alex Nugent: Universal logic gate utilizing nanotechnology. Knowmtech, Kermit D Lopez, Luis M Ortiz, Ortiz & Lopez PLLC, September 20, 2011: US08022732 (12 worldwide citation)

A universal logic gate apparatus is disclosed, which include a plurality of self-assembling chains of nanoparticles having a plurality of resistive connections, wherein the plurality of self-assembling chains of nanoparticles comprise resistive connects utilized to create A plasticity mechanism is a ...


104
Kley Victor B: Fluid delivery for scanning probe microscopy. General Nanotechnology, YEE George BF, March 18, 2004: WO/2004/023490 (12 worldwide citation)

The following invention pertains to the introduction of a gas (or fluid) around a MEMS cantilever (f100) having an SPM probe or Nanotool (TM) to control chemical activity, e.g. oxygen to promote oxidation, argon to inhibit oxidation or clean dry air (CDA) to inhibit moisture to control static chargi ...


105
Tapesh Yadav, Ming Au, Evan Franke: Nanotechnology for chemical radiation, and biotechnology sensors. NanoProducts Corporation, Stuart T Langley, Hogan & Hartson, May 27, 2003: US06569490 (12 worldwide citation)

Nanostructured non-stoichiometric materials are disclosed. Novel sensing materials and their applications are discussed. More specifically, the specifications teach the use of nanotechnology and nanostructured materials for developing novel sensing devices and products.


106
Steven M Trimberger, Shekhar Bapat, Robert W Wells, Robert D Patrie, Andrew W Lai: Application-specific methods for testing molectronic or nanoscale devices. Xilinx, Arthur J Behiel, LeRoy D Maunu, May 15, 2007: US07219314 (11 worldwide citation)

Described are methods for implementing customer designs in programmable logic devices (PLDs). The defect tolerance of these methods makes them particularly useful with the adoption of “nanotechnology” and molecular-scale technology, or “molectronics.” Test methods identify alternative physical inter ...


107
Toshiaki Fujii: Method of making lamina specimen. SII NanoTechnology, Adams & Wilks, April 20, 2010: US07700367 (11 worldwide citation)

In a method of making a lamina specimen, first and second ion beams are simultaneously used to sputter etch first and second side walls of a lamina region at the same time under first and second ion beam conditions. A scanning ion microscope observation of the lamina region is made using the second ...


108
John Wun Sing Chu: Electromechanical lock employing shape memory metal wire. Nanotechnology, August 5, 2008: US07406846 (11 worldwide citation)

An electronic lock incorporating one or more shape memory metal wire segment as its electromechanical transducer. An electronic control circuit injects electrical current into the shape memory metal wire, causing it to heat up and contract. A gate is positioned by the action of the shape memory meta ...


109
Roger Proksch, Jason Cleveland, Dan Bocek: Diffractive optical position detector. Asylum Research, Morgan Lewis & Bockius, April 26, 2005: US06884981 (11 worldwide citation)

An apparatus and method for measuring optically the position or angle of a variety of objects or arrays of objects, including cantilevers in scanning probe microscopy, micromechanical biological and chemical sensors and the sample or a probe in surface profilometry. The invention involves the use of ...


110
Ritter Rudolf: Electronic component with a measuring sensor and a wireless interface. Swisscom Mobile, December 21, 2005: EP1607723-A1 (11 worldwide citation)

An electronic sensor unit (1) has a MEMS (Micro-ElectroMechanical Sensor) or nanotechnology physical or chemical status sensor (13) that unlocks data transmission over an RFID tag wireless interface (11) to a local read unit (2, 3) also providing power when the electrical status value (c) exceeds a ...