1
January Kister: Multiple contact probes. MicroProbe, Deborah A Peacock, Philip D Askenazy, Peacock Myers P C, March 24, 2015: US08988091 (3 worldwide citation)

The present invention is a probe array for testing an electrical device under test comprising one or more ground/power probes and one or more signal probes and optionally a gas flow apparatus.


2
Williams Anthony Michael: Compliant link and positioning device for tool on robot arm. Emi Thorn, November 29, 1989: GB2218963-A (3 worldwide citation)

A mechanism for coupling a tool G to a robot arm A and for aligning the tool orthogonally with respect to a curved or even double curved work surface S. There is a first compliant arrangement C connected to the robot arm and a second compliant arrangement 20 connected between the first and the tool. ...


3
KISTER January: SONDES DE CONTACT MULTIPLES, MULTIPLE CONTACT PROBES. MICROPROBE, KISTER January, UPDEGRAFF Samantha A, March 22, 2012: WO/2012/036922 (2 worldwide citation)

The present invention is a probe array for probing a device using a power probe pin with one or more projections or skates to enhance scrub performance and having a width greater than the input signal probe pin to avoid high current damage to the probe. An additional invention is the provision of a ...


4
January Kister: Multiple contact probes. FormFactor, Peacock Myers P C, Deborah A Peacock, Philip D Askenazy, April 19, 2016: US09316670

The present invention is a probe array for testing an electrical device under test comprising one or more ground/power probes and one or more signal probes and optionally a gas flow apparatus.


5
Yoshio Yamada, Makoto Yumino, Mitsuhiro Kondo, Satoshi Shoji: Probe unit. NHK Spring, Locke Lord, July 11, 2017: US09702905

The probe unit includes probe groups of two or more contact probes to be in contact with one electrode of a contact target body on a side of one end in a longitudinal direction and the respective contact probes are to be in contact with separate electrodes of a board on a side of another end. The co ...


6
Teruo Anraku, Masayuki Ainoya, Tomohiro Kubota, Kotaro Toyotake, Tomoyuki Minami, Noritoshi Takamura, Humio Takahashi: Alloy material, contact probe, and connection terminal. Yamamoto Precious Metal, Shinko Metal Products, NHK Spring, Locke Lord, October 31, 2017: US09804198

An alloy material includes: a composition containing 17 at % to 25 at % of silver (Ag), 30 at % to 45 at % of palladium (Pd), and 30 at % to 53 at % of copper (Cu) in a composition range of a ternary alloy of Ag, Pd, and Cu; and at least one of manganese (Mn), tin (Sn), silicon (Si), antimony (Sb), ...


7
Mingjing Huang, Jacob E Ben Poorat: Multiple contact pogo pin. Intel Corporation, Schwegman Lundberg & Woessner P A, August 29, 2017: US09748680

Disclosed herein are devices and methods for a multiple contact probe. The multiple contact probe may include a first contact interface and a second contact interface. The first contact interface may be electrically isolated from the second contact interface. A plunger assembly may be slidably engag ...


8
Eniko Todorov Enikov: Contoured facial mask with multiple contact probes for use with tactile tonometer. THE ARIZONA BOARD OF REGENTS ON BEHALF OF THE UNIVERSITY OF ARIZONA, Hayes Soloway P C, October 13, 2015: US09155467

A system for measuring intraocular pressure (IOP) of an eye, comprising a plurality of force sensors that are adapted to contact a surface of an eye, measuring the forces exerted on the force sensors when in contact with the eye surface, and processing the measured forces to determine the 10P of the ...


9
Hiroshi Yamada, Hiroki Obi: Probe card attaching method. Tokyo Electron, Pearne & Gordon, February 14, 2017: US09568501

A probe card attaching method makes it easy to attach/detach a probe card to/from a transfer stage. In a wafer inspection apparatus 10, a reference position is determined by moving a transfer stage 18 to align a stage-side camera 28 with a tester-side camera 16 in a tester 15, a first distance from ...


10
Takashi Amemiya: Substrate inspection apparatus and probe card transferring method. Tokyo Electron, Pearne & Gordon, June 6, 2017: US09671452

A wafer inspection apparatus 10 includes a middle plate 22 that mounts a probe card 18 in which multiple contact probes 20 are provided; a drawer type table 21 in which the middle plate 22 is provided; a tester 15 to which the probe card 18 is mounted; and a transfer robot 17 that transfers the midd ...