1
Peter Dürr: Method to detect a defective element. Micronic Laser Systems, Ernest J Beffel Jr, Haynes Beffel & Wolfeld, June 13, 2006: US07061226 (44 worldwide citation)

The present invention relates to a method to detect at least one defective pixel in a spatial light modulator comprising numerous pixel elements. The spatial light modulator is imaged to a detector. A relayed image of a first chess-board pattern of pixels in said spatial light modulator is detected ...


2
Peter Durr: Method to detect a defective element. Micronic Laser Systems, Fraunhofer Gesellschaft zur Forderung der Angewandten Forschung eV, Haynes Beffel & Wolfeld, October 21, 2004: US20040207386-A1

The present invention relates to a method to detect at least one defective pixel in a spatial light modulator comprising numerous pixel elements. The spatial light modulator is imaged to a detector. A relayed image of a first chess-board pattern of pixels in said spatial light modulator is detected ...


3
Durr Peter: Method to detect a defective element. Micronic Laser Systems, ma gaobeng yang wu, January 18, 2006: CN200480001745

The present invention relates to a method to detect at least one defective pixel in a spatial light modulator comprising numerous pixel elements. The spatial light modulator is imaged to a detector. A relayed image of a first chess-board pattern of pixels in said spatial light modulator is detected ...