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Yoshikazu Ohe: Method of testing IC memories. Fujitsu, Staas & Halsey, November 12, 1985: US04553225 (44 worldwide citation)

In a method of testing IC memories, at first, predetermined data such as all "0" or all "1" is written into an IC memory at a normal-operation power-supply voltage, and the written data is read out and confirmed. Next, the power-supply voltage is lowered and is then returned to the normal-operation ...


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