1
Yooji Yamaki, Shigenori Sakai: Method of repairing semiconductor memory. Hitachi, Antonelli Terry & Wands, December 2, 1986: US04627053 (19 worldwide citation)

In a method of repairing a semiconductor memory device having spare lines, all possible solutions of remedy using spare lines or spare blocks are obtained based on the result of test for the device, and then the possible solutions are screened under conditions related to the quality and reliability ...


2
Naoki Nishio, Hideyuki Fukuhara, Yoichi Miyai, Yoshinobu Kagawa: Method of repairing semiconductor memory, electron-beam memory repairing apparatus and redundancy memory circuit to which the method of repairing semiconductor memory is applicable. Advantest Corporation, Knobbe Martens Olson & Bear, August 13, 2002: US06434063 (2 worldwide citation)

A semiconductor memory chip has fuses and a redundancy memory cell which can replace a normal memory cell that is found defective by cutting off the fuses. If the normal memory cell is defective, the fuses are cut off thereby to connect the redundancy memory cell instead of the normal memory cell wh ...


3
Naoki Nishio, Hideyuki Fukuhara, Yoichi Miyai, Yoshinobu Kagawa: Method of repairing semiconductor memory, electron-beam memory repairing apparatus and redundancy memory circuit to which the method of repairing semiconductor memory is applicable. Advantest Corporation, Texas Instruments Japan, November 16, 1999: US05985677 (1 worldwide citation)

A semiconductor memory chip has fuses and a redundancy memory cell which can replace a normal memory cell that is found defective by cutting off the fuses. If the normal memory cell is defective, the fuses are cut off thereby to connect the redundancy memory cell instead of the normal memory cell wh ...