1
Roger Harquail French, Timothy Gierke, Mark Andrew Harmer, Anand Jagota, Steven Raymond Lustig, Rakesh H Mehta, Paula Beyer Hietpas, Bibiana Onoa: Method for providing nano-structures of uniform length. E I du Pont de Nemours and Company, September 20, 2005: US06946410 (104 worldwide citation)

This invention relates to the field of nanotechnology. Specifically the invention describes a method for cutting a multiplicity of nano-structures to uniform dimensions of length, length and width, or area, or to a specific distribution of lengths or area using various cutting techniques.


2
Roger Harquail French, Timothy Gierke, Mark Andrew Harmer, Anand Jagota, Steven Raymond Lustig, Rakesh H Mehta, Paula Beyer Hietpas, Bibiana Onoa: Method for providing nano-structures of uniform length. E I du Pont de Nemours and Company, February 14, 2006: US06998358 (54 worldwide citation)

This invention relates to the field of nanotechnology. Specifically the invention describes a method for cutting a multiplicity of nano-structures to uniform dimensions of length, length and width, or area, or to a specific distribution of lengths or area using various cutting techniques.


3
Roger Harquail French, Timothy Gierke, Mark Andrew Harmer, Anand Jagota, Steven Raymond Lustig, Rakesh H Mehta, Paula Beyer Hietpas, Bibiana Onoa: Method for providing nano-structures of uniform length. E I Du Pont de Nemours And Company, Legal Patent Records Center, February 26, 2004: US20040038556-A1

This invention relates to the field of nanotechnology. Specifically the invention describes a method for cutting a multiplicity of nano-structures to uniform dimensions of length, length and width, or area, or to a specific distribution of lengths or area using various cutting techniques.


4
Roger Harquail French, Timothy Gierke, Mark Andrew Harmer, Anand Beyer Jagota, Steven Raymond Lustig, Rakesh H Mehta, Paula Beyer Hietpas, Bibiana Onoa: Method for providing nano-structures of uniform length. E I Du Pont de Nemours And Company, Legal Patent Records Center, April 14, 2005: US20050079666-A1

This invention relates to the field of nanotechnology. Specifically the invention describes a method for cutting a multiplicity of nano-structures to uniform dimensions of length, length and width, or area, or to a specific distribution of lengths or area using various cutting techniques.


5
Roger Harquail French, Timothy Gierke, Mark Andrew Harmer, Paula Beyer Hietpas, Anand Jagota, Steven Raymond Lustig, Rakesh Mehta, Bibiana Onoa: Method for providing nano-structures of uniform length. Ei Du Pont de Nemours And Company, E I Du Pont de Nemours And Company, Legal Patent Records Center, January 19, 2006: US20060014084-A1

This invention relates to the field of nanotechnology. Specifically the invention describes a method for cutting a multiplicity of nano-structures to uniform dimensions of length, length and width, or area, or to a specific distribution of lengths or area using various cutting techniques.


6
French Roger Harquail, Gierke Timothy, Harmer Mark Andrew, Hietpas Paula Beyer, Jagota Anand, Lustig Steven Raymond, Mehta Rakesh, Onoa Bibiana: Method for providing nano-structures of uniform length. Ei Du Pont de Nemours And Company, French Roger Harquail, Gierke Timothy, Harmer Mark Andrew, Hietpas Paula Beyer, Jagota Anand, Lustig Steven Raymond, Mehta Rakesh, Onoa Bibiana, FELTHAM S Neil, October 23, 2003: WO/2003/086961

This invention relates to the field of nanotechnology. Specifically the invention describes a method for cutting a multiplicity of nano­structures to uniform dimensions of length, length and width, or area, or to a specific distribution of lengths or area using various cutting techniques.



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