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Richard E Huff, Miklos Perlaki: Membrane probe with automatic contact scrub action. Robert P Sabath, Edward Y Wong, April 17, 1990: US04918383 (145 worldwide citation)

An apparatus [10] for providing an automatic lateral scrubbing motion when a test membrane [22] engages a device under test (DUT) (not shown). Included are a fixed length flexure pivot assembly [30] and a pair of variable length flexure pivot assemblies [38]. Signal traces, signal trace terminals, a ...


2
Huff Richard E, Perlaki Miklos: Membrane probe with automatic contact scrub action.. Hewlett Packard Co, May 8, 1991: EP0425744-A1

An apparatus (10) for providing an automatic lateral scrubbing motion when a test membrane (22) engages a device under test (DUT). Included are fixed length springs (30) and variable length springs (38). Electrical conducting means (23, 25, 60) are formed for communicating between the apparatus (10) ...