41
Silverbrook Kia: Cmos process compatible fabrication of print heads. Eastman Kodak Co, March 19, 1997: EP0763430-A2 (117 worldwide citation)

A manufacturing process for printing heads (50) which integrates many nozzles into a single monolithic silicon structure. The nozzles (200) are etched through the silicon substrate, allowing two dimensional arrays of nozzles (200) for printing. The manufacturing process can be based on existing CMOS ...


42
Ming Yin Hao, Robert Bertram Ogle Jr, Derick Wristers: Ultrathin oxynitride structure and process for VLSI applications. Advanced Micro Devices, Gerald M Fisher, August 17, 1999: US05939763 (116 worldwide citation)

A process for growing an ultra-thin dielectric layer for use as a MOSFET gate oxide or a tunnel oxide for EEPROM's is described. A silicon oxynitride layer, with peaks in nitrogen concentration at the wafer-oxynitride interface and at the oxynitride surface and with low nitrogen concentration in the ...


43
Vincent Ming Chun Chen: System for monitoring and analyzing manufacturing processes using statistical simulation with single step feedback. Advanced Micro Devices, Ken J Koestner, Skjerven Morrill MacPherson Franklin & Friel, February 17, 1998: US05719796 (111 worldwide citation)

A statistical simulation of a semiconductor fabrication process is performed in parallel with the actual process. Input parameters derived from a probability density function are applied to the simulator which, in turn, simulates an actual fabrication process which is modeled as a probability densit ...


44
William E Mickols: Composite membrane and method for making the same. The Dow Chemical Company, Edward W Black, January 8, 2002: US06337018 (105 worldwide citation)

A composite membrane and method for making the same, comprising a porous support and a crosslinked polyamide surface. The subject membrane provides improved flux and/or rejection rates. The subject membrane is further capable of operating at lower operating pressures. The subject method includes rea ...


45
Jean Pierre Meijer, Dirk O van Peteghem, Frank Berkhof, Ronny A W Aerts, Gerald A Sandoval: System and method for integrating a business environment, a process control environment, and a laboratory environment. The Dow Chemical Company, Dale H Schultz, Daniel N Yannuzzi, October 31, 2000: US06141647 (104 worldwide citation)

A system and method for integrating a business transaction processing system, a process control system, and a laboratory system provides a computer integrated manufacturing environment. The manufacturing execution system receives work orders from the business transaction processing system and obtain ...


46
Allan S Hoffman, Patrick S Stayton: Interactive molecular conjugates. University of Washington, Arnall Golden & Gregory, December 7, 1999: US05998588 (104 worldwide citation)

The combination of the capabilities of stimuli-responsive components such as polymers and interactive molecules to form site-specific conjugates which are useful in a variety of assays, separations, processing, and other uses is disclosed. The polymer chain conformation and volume can be manipulated ...


47
John Gregg, Scott Battle, Jeffrey I Banton, Donn Naito, Marianne Fuierer: Vaporizer delivery ampoule. Advanced Technology Materials, Marianne Fuierer, Margaret Chappuis, Tristan A Fuierer, July 26, 2005: US06921062 (104 worldwide citation)

A vaporizer delivery system for use in semiconductor manufacturing processes including a plurality of vertically stacked containers for holding a vaporizable source material. Each of the vertically stacked containers includes a plurality of vented protuberances extending into the interior of the eac ...


48
Vincent Ming Chun Chen: Method for monitoring and analyzing manufacturing processes using statistical simulation with single step feedback. Advanced Micro Devices, Ken J Koestner, Skjerven Morrill MacPherson Franklin & Friel, October 12, 1999: US05966312 (104 worldwide citation)

A statistical simulation of a semiconductor fabrication process is performed in parallel with the actual process. Input parameters derived from a probability density function are applied to the simulator which, in turn, simulates an actual fabrication process which is modeled as a probability densit ...


49
Pei Choa Wang: LED illumination apparatus. Pyroswift Holding Co, April 7, 2009: US07513639 (98 worldwide citation)

An LED illumination apparatus includes a lamp housing, an LED module, distal covers and a light-transmitting hood. The lamp housing has a base, a heat sink at the top of the base, a heat dissipating channel between two adjacent heat sinks, and a receiving portion on an internal side of the base. The ...


50
Jim Kenney, John Leon: Statistical process control integration systems and methods for monitoring manufacturing processes. Circuit Image Systems, Knobbe Martens Olson & Bear, September 3, 2002: US06445969 (97 worldwide citation)

A method and system for monitoring process parameters associated with a manufacturing or testing process. The system includes: at least one machine which is used in the manufacturing or testing process; at least one sensing device, coupled to the at least one machine, for measuring a process paramet ...