41
Ming Yin Hao, Robert Bertram Ogle Jr, Derick Wristers: Ultrathin oxynitride structure and process for VLSI applications. Advanced Micro Devices, Gerald M Fisher, August 17, 1999: US05939763 (114 worldwide citation)

A process for growing an ultra-thin dielectric layer for use as a MOSFET gate oxide or a tunnel oxide for EEPROM's is described. A silicon oxynitride layer, with peaks in nitrogen concentration at the wafer-oxynitride interface and at the oxynitride surface and with low nitrogen concentration in the ...


42
Douglas S Steele, Larry C Howington, James W Schuler, Joseph J Sostarich, Charles R Wojciechowski, Theodore W Sippel, Joseph M Portaz, Ralph G Isaacs, Henry J Scudder III, Thomas G Kincaid, Kristina H V Hedengren, Rudolph A A Koegl, John P Keaveney, Joseph Czechowski III, John R Brehm, James M Brown Jr, David W Oliver, George E Williams, Richard D Miller: X-ray inspection system. General Electric Company, Derek P Lawrence, Nathan D Herkamp, February 7, 1989: US04803639 (113 worldwide citation)

An X-ray inspection system for manually or automatically performing digital fluoroscopy inspections and/or computed tomography inspections by X-ray examination of manufactured parts incorporates a computer system which automatically analyzes the inspected parts for flaws. The system includes apparat ...


43
Vincent Ming Chun Chen: System for monitoring and analyzing manufacturing processes using statistical simulation with single step feedback. Advanced Micro Devices, Ken J Koestner, Skjerven Morrill MacPherson Franklin & Friel, February 17, 1998: US05719796 (106 worldwide citation)

A statistical simulation of a semiconductor fabrication process is performed in parallel with the actual process. Input parameters derived from a probability density function are applied to the simulator which, in turn, simulates an actual fabrication process which is modeled as a probability densit ...


44
Allan S Hoffman, Patrick S Stayton: Interactive molecular conjugates. University of Washington, Arnall Golden & Gregory, December 7, 1999: US05998588 (104 worldwide citation)

The combination of the capabilities of stimuli-responsive components such as polymers and interactive molecules to form site-specific conjugates which are useful in a variety of assays, separations, processing, and other uses is disclosed. The polymer chain conformation and volume can be manipulated ...


45
John Gregg, Scott Battle, Jeffrey I Banton, Donn Naito, Marianne Fuierer: Vaporizer delivery ampoule. Advanced Technology Materials, Marianne Fuierer, Margaret Chappuis, Tristan A Fuierer, July 26, 2005: US06921062 (104 worldwide citation)

A vaporizer delivery system for use in semiconductor manufacturing processes including a plurality of vertically stacked containers for holding a vaporizable source material. Each of the vertically stacked containers includes a plurality of vented protuberances extending into the interior of the eac ...


46
Vincent Ming Chun Chen: Method for monitoring and analyzing manufacturing processes using statistical simulation with single step feedback. Advanced Micro Devices, Ken J Koestner, Skjerven Morrill MacPherson Franklin & Friel, October 12, 1999: US05966312 (104 worldwide citation)

A statistical simulation of a semiconductor fabrication process is performed in parallel with the actual process. Input parameters derived from a probability density function are applied to the simulator which, in turn, simulates an actual fabrication process which is modeled as a probability densit ...


47
William E Mickols: Composite membrane and method for making the same. The Dow Chemical Company, Edward W Black, January 8, 2002: US06337018 (104 worldwide citation)

A composite membrane and method for making the same, comprising a porous support and a crosslinked polyamide surface. The subject membrane provides improved flux and/or rejection rates. The subject membrane is further capable of operating at lower operating pressures. The subject method includes rea ...


48
Jean Pierre Meijer, Dirk O van Peteghem, Frank Berkhof, Ronny A W Aerts, Gerald A Sandoval: System and method for integrating a business environment, a process control environment, and a laboratory environment. The Dow Chemical Company, Dale H Schultz, Daniel N Yannuzzi, October 31, 2000: US06141647 (102 worldwide citation)

A system and method for integrating a business transaction processing system, a process control system, and a laboratory system provides a computer integrated manufacturing environment. The manufacturing execution system receives work orders from the business transaction processing system and obtain ...


49
Pei Choa Wang: LED illumination apparatus. Pyroswift Holding Co, April 7, 2009: US07513639 (98 worldwide citation)

An LED illumination apparatus includes a lamp housing, an LED module, distal covers and a light-transmitting hood. The lamp housing has a base, a heat sink at the top of the base, a heat dissipating channel between two adjacent heat sinks, and a receiving portion on an internal side of the base. The ...


50
Jim Kenney, John Leon: Statistical process control integration systems and methods for monitoring manufacturing processes. Circuit Image Systems, Knobbe Martens Olson & Bear, September 3, 2002: US06445969 (96 worldwide citation)

A method and system for monitoring process parameters associated with a manufacturing or testing process. The system includes: at least one machine which is used in the manufacturing or testing process; at least one sensing device, coupled to the at least one machine, for measuring a process paramet ...