1
January Kister: Low profile probe having improved mechanical scrub and reduced contact inductance. MicroProbe, Samantha A Updegraff, Peacock Myers P C, January 19, 2010: US07649367 (19 worldwide citation)

A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, su ...


2
January Kister: Low profile probe having improved mechanical scrub and reduced contact inductance. MicroProbe, Deborah A Peacock, Samantha A Updegraff, Peacock Myers P C, April 9, 2013: US08415963 (11 worldwide citation)

A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, su ...


3
January Kister: Low profile probe having improved mechanical scrub and reduced contact inductance. MicroProbe, Deborah A Peacock, Samantha A Updegraff, Peacock Myers P C, May 17, 2011: US07944224 (8 worldwide citation)

A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, su ...


4
January Kister: Low profile probe having improved mechanical scrub and reduced contact inductance. Lumen Patent Firm, October 30, 2008: US20080265873-A1

A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, su ...


5
January Kister: Low Profile Probe Having Improved Mechanical Scrub and Reduced Contact Inductance. MicroProbe, Peacock Myers PC, May 6, 2010: US20100109691-A1

A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, su ...


6
January Kister: Low profile probe having improved mechanical scrub and reduced contact inductance. Microprobe, November 10, 2011: US20110273198-A1

A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, su ...