1
January Kister: Layered probes with core. FormFactor, Peacock Myers P C, Deborah A Peacock, Philip D Askenazy, August 4, 2015: US09097740 (3 worldwide citation)

A probe for testing an electrical device under test. The probe has at least two outer layers and a core layer that is highly conductive. The core layer is disposed between the outer layers.


2
January Kister: Layered Probes With Core. MicroProbe, Peacock Myers PC, July 22, 2010: US20100182031-A1

The present invention is a probe for testing an electrical device under test comprising a core layer that is highly conductive.