1
Martin Perner: Integrated memory and method for testing and repairing the integrated memory. Infineon Technologies, Laurence A Greenberg, Werner H Stemer, Ralph E Locher, July 8, 2003: US06590816 (142 worldwide citation)

The integrated memory has memory cells in a memory cell block having a plurality of column lines and a plurality of row lines. The row lines include regular row lines and redundant row lines. In the event of a read access to a current row line, a self-test unit checks the correctness of the memory c ...


2
Martin Perner: Integrated memory and method for testing and repairing the integrated memory. Lerner And Greenberg Pa, Patent Attorneys And Attorneys At Law, September 5, 2002: US20020122341-A1

The integrated memory has memory cells in a memory cell block having a plurality of column lines and a plurality of row lines. The row lines include regular row lines and redundant row lines. In the event of a read access to a current row line, a self-test unit checks the correctness of the memory c ...