1
Toshiyuki Kiyokawa, Hisao Hayama: IC test equipment. Advantest Corporation, Staas & Halsey, December 15, 1992: US05172049 (126 worldwide citation)

In IC test equipment in which an IC element sucked by an air chuck is carried in the horizontal direction by an X-Y transport unit and the air chuck is lowered toward a test head to load the IC element onto a socket provided on a performance board for test, the socket has a contact housing room defi ...


2
Kempei Suzuki, Yushi Iwanaga, Hiroshi Sato, Kohei Sato, Noriyuki Igarashi, Shinichi Koya: IC test equipment. Takeda Riken, Staas & Halsey, September 8, 1987: US04691831 (53 worldwide citation)

An IC element supplied to a testing station is guided by a rail and a guide member to move by its own weight. At least one of the rail and guide member has built therein plate-shaped ceramic heater or plate-shaped silicone rubber heater. The guide member urges the IC element against the rail to heat ...


3
Masakazu Ando: IC test equipment. Advantest Corporation, Staas & Halsey, December 1, 1987: US04710704 (27 worldwide citation)

A test pattern is supplied to the IC under test and a current corresponding to the power supply current of the IC is obtained from a current converter. A reference current reverse in polarity from the output current of the current converter is yielded from a reference current source. The output curr ...


4
Hiroshi Sato, Yoshihito Kobayashi: IC test equipment having input magazine replenisher. Takeda Riken, Staas & Halsey, August 2, 1988: US04760924 (19 worldwide citation)

Magazines, each loaded in series with IC elements to be tested, are stacked and such stacked magazines are arranged in columns. The lowermost magazines of the stacked magazines of the respective columns are simultaneously brought down by a takeout mechanism onto a magazine receiver, and the magazine ...


5
Kempei Suzuki, Hiroto Nakamura: IC test equipment having a horizontally movable chuck carrier. Advantest Corporation, Staas & Halsey, January 5, 1993: US05177434 (13 worldwide citation)

A tray, on which IC elements to be tested are arranged at a pitch P1, is disposed at a first position, a performance board, which has a plurality of testing stations at a pitch P2, is disposed at a second position, and an IC chuck carrier is guided between the first and second positions by X-axis an ...


6
Hiroshi Sato, Yoshihito Kobayashi: IC test equipment. Takeda Riken, Staas & Halsey, December 29, 1987: US04715501 (10 worldwide citation)

Magazines, each loaded in series with IC elements to be tested, are stacked and such stacked magazines are arranged in columns. The lowermost magazines of the stacked magazines of the respective columns are simultaneously brought down by a takeout mechanism onto a magazine receiver, and the magazine ...


7

8
Yoshihito Kobayashi: IC test equipment. Advantest Corporation, Staas & Halsey, November 16, 1993: US05261775 (7 worldwide citation)

In IC test equipment which has an input magazine support station for supporting a magazine discharged from an input magazine stocker and an output magazine support station for supporting a magazine into which IC elements tested in a testing station are loaded, a magazine inverting device is provided ...


9
Toshiyuki Kiyokawa, Noriyuki Igarashi, Hisao Hayama: IC test equipment. Advantest Corporation, Staas & Halsey, January 5, 1993: US05177435 (7 worldwide citation)

A vertical drive unit is mounted on a fixed beam provided above a performance board for testing IC elements and fixed to a support frame. An X-Y carrier head of an X-Y transport unit mounted on the support frame is movable in a planar area including space between the vertical drive unit and the perf ...


10
Kouichirou Kurihara: IC test equipment, measurement method in the IC test equipment, and storage medium of the same. Ando Electric, Flynn Thiel Boutell & Tanis P C, October 12, 1999: US05964894 (3 worldwide citation)

An IC test equipment corrects the timing data for generating the strobe signal by each of the paths corresponding to a plurality of the devices under test measured in parallel and achieves an accurate measurement by each path, a measurement method in the IC test equipment, and a storage medium of th ...