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Victor B Kley: High speed measurement, analysis and imaging systems and methods for length scales from meter to sub-nanometer. Victor B Kley, Townsend and Townsend and Crew, August 24, 2010: US07784107 (7 worldwide citation)

An system for the measurement, analysis, and imaging of objects and surfaces in a variety of sizes is provided. In the most general terms, the invention relates to a device capable of measuring an object using a combination of low-resolution optical, high-resolution optical, SPM/AFM and/or material ...


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Kley Victor B: High-speed measurement, analysis and imaging systems and methods for length scales from meter to sub-nanometer. Kley Victor B, CRETSINGER Cathy E, December 24, 2008: WO/2008/156474 (3 worldwide citation)

An system for the measurement, analysis, and imaging of objects and surfaces in a variety of sizes is provided. In the most general terns, the invention relates to a device capable of measuring an object using a combination of low-resolution optical, high-resolution optical, SPM/AFM and/or material ...


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Kley Victor B: High-speed measurement, analysis and imaging systems and methods for length scales from meter to sub-nanometer. Kley Victor B, March 18, 2009: EP2036096-A1

An system for the measurement, analysis, and imaging of objects and surfaces in a variety of sizes is provided. In the most general terms, the invention relates to a device capable of measuring an object using a combination of low-resolution optical, high-resolution optical, SPM/AFM and/or material ...


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Victor B Kley: High Speed Measurement, Analysis and Imaging Systems and Methods For Length Scales From Meter to Sub-Nanometer. Townsend And Townsend And Crew, June 12, 2008: US20080135750-A1

An system for the measurement, analysis, and imaging of objects and surfaces in a variety of sizes is provided. In the most general terms, the invention relates to a device capable of measuring an object using a combination of low-resolution optical, high-resolution optical, SPM/AFM and/or material ...


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Kley Victor B: High-speed measurement, analysis and imaging systems and methods for length scales from meter to sub-nanometer. Kley Victor B, Meng Dui, August 5, 2009: CN200780028911

An system for the measurement, analysis, and imaging of objects and surfaces in a variety of sizes is provided. In the most general terms, the invention relates to a device capable of measuring an object using a combination of low-resolution optical, high-resolution optical, SPM/AFM and/or material ...