1
Private
Mark P Bendyk, Daniel F Casper, John R Flanagan, Roger G Hathorn, Catherine C Huang, Matthew J Kalos, Louis W Ricci, Gustav E Sittmann, Harry M Yudenfriend: Extended measurement word determination at a channel subsystem of an I/O processing system. International Business Machines Corporation, Cantor Colburn, John Campbell, May 3, 2011: US07937507

An article of manufacture, an apparatus, and a method for determining an extended measurement word at a channel subsystem of an I/O processing system using data from a control unit are provided. The article of manufacture includes at least one computer usable medium having computer readable program ...


2
Private
Mark P Bendyk, Daniel F Casper, John R Flanagan, Roger G Hathorn, Catherine C Huang, Matthew J Kalos, Louis W Ricci, Gustav E Sittmann, Harry M Yudenfriend: Extended measurement word determination at a channel subsystem of an i/o processing system. International Business Machines Corporation, Cantor Colburn IBM Poughkeepsie, August 20, 2009: US20090210570-A1

An article of manufacture, an apparatus, and a method for determining an extended measurement word at a channel subsystem of an I/O processing system using data from a control unit are provided. The article of manufacture includes at least one computer usable medium having computer readable program ...