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Eric Strid, K Reed Gleason: Active wafer probe. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, September 23, 2008: US07427868 (23 worldwide citation)

A probe suitable for probing a semiconductor wafer that includes an active circuit. The probe may have a rigid probing member and include a flexible interconnection between the active circuit and a support structure. The active circuit may have a relatively low capacitance as seen by the device unde ...


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Eric Strid, K Reed Gleason: Active wafer probe. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, July 20, 2010: US07759953 (6 worldwide citation)

A probe suitable for probing a semiconductor wafer that includes an active circuit. The probe may include a flexible interconnection between the active circuit and a support structure. The probe may impose a relatively low capacitance on the device under test.


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Strid Eric, Gleason K Reed: Active wafer probe. Cascade Microtech, November 8, 2006: GB2425844-A

A probe suitable for probing a semiconductor wafer that includes an active circuit (16). The probe may include a flexible interconnection (14) between the active circuit (16) and a support structure (10). The probe may impose a relatively low capacitance on the device under test.


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Eric Strid, K Reed Gleason: Active wafer probe. Cascade Microtech, Chernoff Vilhauer Mcclung & Stenzel, December 18, 2008: US20080309358-A1

A probe suitable for probing a semiconductor wafer that includes an active circuit. The probe may include a flexible interconnection between the active circuit and a support structure. The probe may impose a relatively low capacitance on the device under test.


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Eric Strid, K Reed Gleason: Active wafer probe. Chernoff Vilhauer McClung & Stenzel, June 30, 2005: US20050140386-A1

A probe suitable for probing a semiconductor wafer that includes an active circuit. The probe may include a flexible interconnection between the active circuit and a support structure. The probe may impose a relatively low capacitance on the device under test.


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Eric Strid, K Reed Gleason: Active wafer probe. Cascade Microtech, Chernoff Vilhauer Mcclung & Stenzel, October 7, 2010: US20100253377-A1

A probe suitable for probing a semiconductor wafer that includes an active circuit. The probe may include a flexible interconnection between the active circuit and a support structure. The probe may impose a relatively low capacitance on the device under test.


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Strid Eric, Gleason K Reed: Active wafer probe. Cascade Microtech, Strid Eric, Gleason K Reed, RUSSELL Kevin L, July 21, 2005: WO/2005/065258

A probe suitable for probing a semiconductor wafer that includes an active circuit (16). The probe may include a flexible interconnection (14) between the active circuit (16) and a support structure (10). The probe may impose a relatively low capacitance on the device under test.


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Strid Eric, Gleason K Reed: Active wafer probe. Cascade Microtech, December 8, 2006: KR1020067013772

A probe suitable for probing a semiconductor wafer that includes an active circuit (16). The probe may include a flexible interconnection (14) between the active circuit (16) and a support structure (10). The probe may impose a relatively low capacitance on the device under test.


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