1
Bahman Qawami
Chang Robert C, Qawami Bahman, Sabet Sharghi Farshid: Unusable block management within a non-volatile memory system. Sandisk, May 12, 2004: EP1418502-A2 (49 worldwide citation)

Methods and apparatus for tracking defective blocks such that at least some of the defective blocks may be readily identified and tested for usability when desirable are disclosed. According to one aspect of the present invention, a method for identifying spare blocks within a non-volatile memory in ...


2
Bahman Qawami
Chang Robert C, Qawami Bahman, Sabet Sharghi Farshid: Hybrid implementation for error correction codes within a non-volatile memory system. Sandisk, June 2, 2004: EP1424631-A1 (20 worldwide citation)

Methods and apparatus for using different error correction code algorithms to encode and to decode contents of blocks within a non-volatile memory are disclosed. According to one aspect of the present invention, a method for storing data within a non-volatile memory includes identifying a first bloc ...


3
Bahman Qawami
Chang Robert C, Qawami Bahman, Sabet Sharghi Farshid: Hybrid packaging for error correction code in nonvolatile memory system. Sandisk, June 10, 2004: JP2004-164634 (4 worldwide citation)

PROBLEM TO BE SOLVED: To disclose a method and device for making use of different error correction code algorithm to code and decode contents of a block in a nonvolatile memory.SOLUTION: A phase of the method includes a step where a first block in which data are to be stored is identified and a step ...


4
Bahman Qawami
Chang Robert C, Qawami Bahman, Sabet Sharghi Farshid: Management for unworkable block in nonvolatile memory system. Sandisk, May 27, 2004: JP2004-152299 (2 worldwide citation)

PROBLEM TO BE SOLVED: To use a block identified as a defective block but usable potentially as a spare block.SOLUTION: This invention includes a process for subjecting at least one physical block identified as a defective one inside a nonvolatile memory 124 to an inspection, in which it is determine ...


5
yuan xing Lee
Shaohua Yang, Weijun Tan, Yuan Xing Lee: Systems and methods for stepped data retry in a storage system. LSI Corporation, Hamilton DeSanctis & Cha, May 8, 2012: US08176404 (24 worldwide citation)

Various embodiments of the present invention provide systems and methods for data processing retries. As an example, a data processing retry circuit is discussed that includes a stepped erasure window register, and an erasure flag set circuit. The stepped erasure window register includes: an erasure ...


6
yuan xing Lee
Yuan Xing Lee, Morishi Izumita: Permuting MTR code with ECC without need for second MTR code. Hitachi Global Storage Technologies Netherlands, Townsend and Townsend and Crew, Patrick Duncan, May 5, 2009: US07530003 (14 worldwide citation)

Embodiments of the present invention provide techniques for generating MTR codes with ECC without the use of a second MTR code, while still satisfying the specified constraint. In one embodiment, a system for processing data comprises a maximum transition run or timing-varying maximum transition run ...


7
Lan Gu
Gen Pei, Lanlan Gu, Nima Mokhlesi, Idan Alrod, Eran Sharon, Itshak Afriat: Identifying at-risk data in non-volatile storage. March 17, 2011: US20110063918-A1

The non-volatile storage system predicts which blocks (or other units of storage) will become bad based on performance data. User data in those blocks predicted to become bad can be re-programmed to other blocks, and the blocks predicted to become bad can be removed from further use.


8
Private
Michael T Benhase, James Chien Chiung Chen, Chung Man Fung, Matthew J Kalos, Patricia Ching Lu: Apparatus and method to transfer information from a first information storage and retrieval system to a second information storage and retrieval system. International Business Machines Corporation, Dale F Regelman, Quarles & Brady, December 9, 2008: US07464321

A method is disclosed to transfer information from a first information storage and retrieval system to a second information storage and retrieval system. The method provides a first information storage and retrieval system comprising a first track size and a plurality of first tracks, and a second i ...


9
Ishikawa Shinji: Semiconductor memory and its test method. Sharp, March 20, 2003: JP2003-086000 (2666 worldwide citation)

PROBLEM TO BE SOLVED: To provide a semiconductor memory which can easily and accurately discriminate a contact state of an external terminal by same simple timing as that in normal operation without adding an exclusive terminal for test after mounting a semiconductor chip on a board.SOLUTION: This m ...


10
Sanjay Mehrotra, Eliyahou Harari, Winston Lee: Multi-state EEprom read and write circuits and techniques. Sundisk Corporation, Majestic Parsons Siebert & Hsue, December 15, 1992: US05172338 (1028 worldwide citation)

Improvements in the circuits and techniques for read, write and erase of EEprom memory enable non-volatile multi-state memory to operate with enhanced performance over an extended period of time. In the improved circuits for normal read, and read between write or erase for verification, the reading ...