1
Joshua G Nickel: Test system with temporary test structures. Apple, Treyz law Group, Jason Tsai, October 13, 2015: US09157954 (74 worldwide citation)

Electronic device structures such as a conductive housing member that forms part of an antenna may be tested during manufacturing. A test system may be provided that includes a test probe configured to energize the conductive housing member or other conductive structures under test and that includes ...


2
Christopher V Sellathamby, Steven Slupsky, Brian Moore: Method and apparatus for interrogating electronic equipment components. Scanimetrics, Davis & Bujold PLLC, Michael J Bujold, September 9, 2014: US08829934 (74 worldwide citation)

An apparatus for interrogating an electronic circuit supported by a substrate includes a tester external to the substrate and comprising an tester transceiver. A testing circuit is supported by the substrate and connected to the electronic circuit. The testing circuit includes a processor and a test ...


3
William J Cote, Yi Feng, Oliver D Patterson: Probe-able voltage contrast test structures. International Business Machines Corporation, Cantor Colburn, Ian MacKinnon, January 8, 2013: US08350583 (64 worldwide citation)

Test structures and method for detecting defects using the same. A probe-able voltage contrast (VC) comb test structure that includes first, second and third probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines, switching devices coupled with an end p ...


4
William J Cote, Yi Feng, Oliver D Patterson: Probe-able voltage contrast test structures. International Business Machines Corporation, Cantor Colburn, Steven Meyers, December 15, 2015: US09213060 (43 worldwide citation)

Test structures and method for detecting defects using the same. A probe-able voltage contrast (VC) comb test structure that includes first, second and third probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines, switching devices coupled with an end p ...


5
William J Cote, Yi Feng, Oliver D Patterson: Probe-able voltage contrast test structures. International Business Machines Corporation, Cantor Colburn, William Steinberg, August 11, 2015: US09103875 (43 worldwide citation)

Test structures and method for detecting defects using the same. A probe-able voltage contrast (VC) comb test structure that includes first, second and third probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines, switching devices coupled with an end p ...


6
William J Cote, Yi Feng, Oliver D Patterson: Probe-able voltage contrast test structures. International Business Machines Corporation, Cantor Colburn, William Steinberg, August 4, 2015: US09097760 (43 worldwide citation)

Test structures and method for detecting defects using the same. A probe-able voltage contrast (VC) comb test structure that includes first, second and third probe pads, a comb-like structure including grounded tines, floating tines between the grounded tines, switching devices coupled with an end p ...


7
John E Nelson, Jeffrey C Sherry, Patrick J Alladio, Russell F Oberg, Brian Warwick, Gary W Michalko: Electrically conductive pins for microcircuit tester. Johnstech International Corporation, Altera Law Group, September 17, 2013: US08536889 (31 worldwide citation)

The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bott ...


8
Seonggoo Kang, Chulwoong Jang, Jaeil Lee: Solid state drive testing apparatus to sort the solid state drives according to a determined operability of each drive. Samsung Electronics, Stanzione & Kim, November 6, 2012: US08305103 (12 worldwide citation)

Provided are apparatus and method of testing solid state drives. The method includes accommodating solid state drives to be tested in a magazine with one or more cassettes, sorting the solid state drives into operable solid state drives or defective solid state drives by testing electrical character ...


9
Scott E Lindsey, Junyje Yeh, Jovan Jovanovic, Seang P Malathong: System for testing an integrated circuit of a device and its method of use. Aehr Test Systems, Stephen M De Klerk, Law Office of Stephen M De Klerk, October 4, 2011: US08030957 (12 worldwide citation)

A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor supp ...


10
Jae Gyun Shim, Yun Sung Na, In Gu Jeon, Tae Hung Ku: Test handler. TechWing, Jefferson IP Law, May 24, 2011: US07948255 (12 worldwide citation)

A test handler is disclosed. The test handler includes first to third transfers for transferring a user tray, and first to third horizontal movement units suitable for respectively moving the first to third transfers in the horizontal direction. The first to third horizontal movement units are indep ...