1
Brian Huppi, Anthony M Fadell, Derek Barrentine, Daniel Freeman: Automated response to and sensing of user activity in portable devices. Apple, Blakely Sokoloff Taylor & Zafman, December 15, 2009: US07633076 (391 worldwide citation)

The various methods and devices described herein relate to devices which, in at least certain embodiments, may include one or more sensors for providing data relating to user activity and at least one processor for causing the device to respond based on the user activity which was determined, at lea ...


2
Gerald D Borgert, Robert J Bartlett, James F Ellison: Illumination system and method for generating an image of an object. Applied Intelligent Systems, Dykema Gossett, May 21, 1996: US05519496 (247 worldwide citation)

An illumination system having a lighting dome, a vertical light source, an image acquisition means, and a light controlling means, a system controller and a three-axis servo system wherein the dome is of unitary printed circuit board construction populated with a plurality of surface mounted light e ...


3
David G Emery, Zain K Saidin, Mark J Wihl, Tao Yi Fu, Marek Zywno, Damon F Kvamme, Michael E Fein: Automated photomask inspection apparatus and method. KLA Instruments Corporation, Allston L Jones, October 8, 1996: US05563702 (227 worldwide citation)

A method and apparatus for inspecting patterned transmissive substrates, such as photomasks, for unwanted particles and features occurring on the transmissive, opaque portions and at the transition regions of the opaque and transmissive portions of the substrate. A transmissive substrate is illumina ...


4
Tetsuo Taniguchi, Masayuki Murayama: Projection exposure apparatus and method. Nikon Corporation, Oblon Spivak McClelland Maier & Neustadt P C, December 17, 2002: US06496257 (171 worldwide citation)

Pattern transfer can be performed with improved exposure accuracy, by reducing the contamination caused by the attachment of a photosensitive agent or the like on an optical member of a projection optical member or the like. The pattern transfer onto a substrate W is performed after cleaning the obj ...


5
Schmidt Ralf: Method for examining sheet-like objects.. Siemens Nixdorf Inf Syst, November 23, 1989: EP0342647-A2 (159 worldwide citation)

In a method for examining sheet-like objects by scanning the sheet-like object with radiation along a given scanning route and generating a succession of scanning signals determined by properties of the sheet-like object, the values of which scanning signals are compared with stored reference values ...


6
Bruce W Worster, Dale E Crane, Hans J Hansen, Christopher R Fairley, Ken K Lee: Laser imaging system for inspection and analysis of sub-micron particles. Ultrapointe Corporation, Alan H MacPherson, Skjerven Morrill MacPherson Franklin & Friel, December 26, 1995: US05479252 (152 worldwide citation)

A laser imaging system is used to analyze defects on semiconductor wafers that have been detected by patterned wafer defect detecting systems (wafer scanners). The laser imaging system replaces optical microscope review stations now utilized in the semiconductor fab environment to examine detected o ...


7
Peter C Jann, Kenneth P Gross, Armand P Neukermans: Particle detector for rough surfaces. Tencor Instruments, Schneck & McHugh, February 23, 1993: US05189481 (142 worldwide citation)

A surface inspection apparatus having multiple inspection stations to inspect a wafer for a number of characteristics. The wafer is placed on a chuck connected to a rack-and-pinion or equivalent system so that the wafer simultaneously rotates and translates under the fixed position of the inspection ...


8
Michael Raab: Method and apparatus for analyzing optical fibers by inducing Brillouin spectroscopy. James Creighton Wray, April 22, 1997: US05623336 (133 worldwide citation)

For the noninvasive investigation of optical fiber lines by means of heterodyne Brillouin spectroscopy light from a pumplaser (10) is directed into one end of the optical fiber line under investigation (16), so that spontaneous Brillouin backscattering is induced in the fiber (16). The light, which ...


9
Norbert Marxer, Kenneth P Gross, Hubert Altendorfer, George Kren: Process and assembly for non-destructive surface inspections. Kla Tencor Corporation, Skjerven Morrill MacPherson, August 7, 2001: US06271916 (132 worldwide citation)

A light beam is directed towards a surface along a direction normal to the surface. The surface is caused to move so that the beam scans the surface along a spiral path. An ellipsoidal mirror is placed with its axis along the surface normal to collect light scattered by the surface and any anomalies ...


10
Bruce W Worster, Dale E Crane, Hans J Hansen, Christopher R Fairley, Ken K Lee: Laser imaging system for inspection and analysis of sub-micron particles. Ultrapointe Corporation, Alan H MacPherson, Gary J Edwards, Skjerven Morrill MacPherson Franklin & Friel, October 5, 1999: US05963314 (127 worldwide citation)

A laser imaging system is used to analyze defects on semiconductor wafers that have been detected by patterned wafer defect detecting systems (wafer scanners). The laser imaging system replaces optical microscope review stations now utilized in the semiconductor fab environment to examine detected o ...