1
Franciscus Albertus Kuypers, Won Chul Lee, Albert P Pisano: Microfluidic flow lysometer device, system and method. Children s Hospital and Research Center at Oakland, David R Stevens, Stevens Law Group, November 6, 2012: US08304245 (4 worldwide citation)

The invention provides a device, system and method that enables a microfluidic flow lysometer cell analyzer. Using a population of suspended living cells. cell surface molecule detection reagents, and cell cytoplasm (or nuclear) molecule detection reagents, this microfluidic cell analyzer can rapidl ...


2
Eung Youl Kang, Won Chul Lee: Fuse region and method of fabricating the same. Samsung Electronics, Marger Johnson & McCollom P C, September 22, 2009: US07592206 (2 worldwide citation)

In one embodiment a fuse region includes an insulating layer disposed on a substrate, a fuse disposed on the insulating layer and including a fuse barrier pattern and a fuse conductive pattern, which are stacked, and a supporting plug disposed beneath the fuse, and penetrating the insulating layer a ...


3
Ji Suk Park, Won Chul Lee: Semiconductor device having moisture-proof dam and method of fabricating the same. Samsung Electronics, Myers Bigel Sibley & Sajovec P A, February 9, 2010: US07659601 (1 worldwide citation)

A semiconductor device having a moisture-proof dam and a method of fabricating the same are provided. The semiconductor device includes an interlayer insulating layer provided on a substrate having a fuse region. A fuse guard dam is provided on the interlayer insulating layer to surround the fuse re ...


4
Won Chul Lee: Integrated circuit fuse structures including spatter shields within opening of an insulating layer and spaced apart from a sidewall of the opening. Samsung Electronics, Myers Bigel Sibley & Sajovec P A, March 2, 2010: US07671443 (1 worldwide citation)

At least one fuse pattern extending in a first direction is formed on a fuse region of a substrate. A preliminary first insulating pattern is formed on the fuse region to cover the fuse pattern. A conductive layer is formed on the preliminary first insulating pattern. The conductive layer and the pr ...


5
Ik Sang Lee, Won Chul Lee: Display apparatus. Samsung Display, H C Park & Associates, July 18, 2017: US09713278

A display apparatus includes a display panel displaying an image, a mold frame disposed under the display panel to support the display panel and a lower receiving container receiving the display panel and the mold frame and having an opening portion, a bottom portion having a chamfered portion that ...


6
Won Chul Lee, Moo Sung Kim: Memory controller, method of operating, and apparatus including same. Samsung Electronics, Volentine & Whitt PLLC, October 24, 2017: US09798656

A method of operating a memory controller includes; counting a number of read operations directed to a page-group of data stored in a block and generating a first read count number, then comparing the first read count number with a first reference count threshold among a first set of reference count ...


7
Jung hoon Han, Sung jin Kim, Cheon bae Kim, Won chul Lee, Byung hoon Cho: Semiconductor device with a multilayer wire. Samsung Electronics, Lee & Morse P C, May 3, 2016: US09331015

A semiconductor device includes a semiconductor structure having a first wire extending in a first direction, an intermetallic insulating layer covering the semiconductor structure, a via structure penetrating the intermetallic insulating layer, and a second wire extending on the intermetallic insul ...


8
Jung Suk Bang, You Young Jin, Sang II Kim, Won Chul Lee: Liquid crystal display. Samsung Display, Innovation Counsel, October 24, 2017: US09798173

A liquid crystal panel (LCD) may include: a flexible liquid crystal panel; and a housing unit for housing the liquid crystal panel. The housing unit may have an integrated structure which includes a bottom surface, a side surface connected from the bottom surface, and a top fixing end connected from ...


9
Eun Kyoung Kim, Myoung Won Yoon, Jong Chul Lee, Oh Suk Kwong, Won Chul Lee: Method of storing data in nonvolatile memory device and method of testing nonvolatile memory device. Samsung Electronics, Volentine & Whitt PLLC, November 10, 2015: US09183946

A method of storing data in a nonvolatile memory device comprises performing a program operation on target memory cells among multiple memory cells, performing a first verify operation to determine whether the target memory cells are in a program pass state or a program fail state, and as a conseque ...


10
Eung Youl Kang, Won Chul Lee: Fuse region and method of fabricating the same. Samsung Electronics, Marger Johnson & Mccollom PC, July 26, 2007: US20070170545-A1

In one embodiment a fuse region includes an insulating layer disposed on a substrate, a fuse disposed on the insulating layer and including a fuse barrier pattern and a fuse conductive pattern, which are stacked, and a supporting plug disposed beneath the fuse, and penetrating the insulating layer a ...



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