1
Gerd K Binnig, J├╝rgen Brugger, Walter Haeberle, Peter Vettiger: Investigation and/or manipulation device. International Business Machines Corporation, Ronald L Drumheller, June 19, 2001: US06249747 (43 worldwide citation)

An investigation and/or manipulation tool for a sample which is locally deformed when subjected to a local heat treatment includes a power supply for heating a tip of the tool wherein the tool has a structure such that the power supplied to the tip heats substantially only the tip of the tool and in ...


2
Gerd K Binnig, Jurgen Brugger, Walter Haeberle, Heinrich Rohrer, Peter Vettiger: Mechanically coupled alternatively usable cantilever structures for scanning a surface. International Business Machines Corporation, Ronald L Drumheller, June 27, 2000: US06079255 (39 worldwide citation)

The present invention concerns a cantilever arrangement for scanning a surface. This arrangement comprises a first cantilever having a first probe and a second cantilever having a second probe. Both cantilevers are mechanically coupled such that the second cantilever follows the movement of the firs ...


3
Gerd K Binnig, Michel Despont, Walter Haeberle, Peter Vettiger: Method of forming ultrasmall structures and apparatus therefor. International Business Machines Corporation, Ronald L Drumheller, April 17, 2001: US06218086 (24 worldwide citation)

The present invention discloses a method of forming ultrasmall (nano) structures in a thin film provided on a substrate by means of a tip which is movable relative to the surface of the thin film. According to principles of the invention, the penetration depth of the tip is limited, thereby avoiding ...


4
Walter Haeberle, Mark I Lutwyche, Peter Vettiger: Magnetic scanning or positioning system with at least two degrees of freedom. International Business Machines Corporation, Marian Underweiser, April 9, 2002: US06369400 (22 worldwide citation)

A scanning or positioning system with at least two degrees of freedom is provided comprising a supporting base equipped with magnets, a movable platform equipped with at least two electrical coils, and suspension elements providing an elastic connection between the movable platform and the supportin ...


5
Walter Haeberle, Gian Luca Bona, Gerd K Binnig, Peter Vettiger: Optical devices. International Business Machines Corporation, Derek S Jennings, September 30, 2003: US06628452 (13 worldwide citation)

An optical device comprises a substrate having a plane surface. An optical path is disposed on the substrate and extends in a plane parallel to the surface of the substrate. A recess intercepts the optical path. An optical element is provided for modifying light incident thereon. The optical element ...


6
Gerd K Binnig, Walter Haeberle, Heinrich Rohrer, Douglas P E Smith: Fine positioning apparatus with atomic resolution. International Business Machines Corporation, James E Murray, September 15, 1998: US05808302 (12 worldwide citation)

A fine-positioning apparatus for a scanning probe microscope includes magnetic solenoid actuators for each of the x, y and z scanning axes of the microscope. The sample is mounted on the coil of one of the actuators for movement of the sample in the z direction while the tunnelling probe is attached ...


7
Gerd K Binning, Michel Despont, Walter Haeberle, Mark A Lantz: Scanning probe for data storage and microscopy. International Business Machines Corporation, F Chau & Associates, September 11, 2007: US07268348 (11 worldwide citation)

A cantilever device for scanning a surface comprises a support, a tip platform and a flexible arm arrangement. The tip platform has a plurality of tips. These comprise at least two contact tips providing points of contact with a surface to be scanned, and a scanning tip for scanning the surface, whe ...


8
Gerd Karl Binnig, Walter Haeberle: Investigation and/or manipulation device for a sample in fluid. International Business Machines Corporation, Casey P August, Whitham Curtis & Whitham, November 3, 1998: US05831153 (9 worldwide citation)

An investigation and/or manipulation device for a sample which is located in a container fluid includes an investigation and/or manipulation tool which is mounted at a first of a cantilever and which during investigation and/or manipulation of the sample immerses into the container fluid. The opposi ...


9

10
Masatoshi Yasutake, Akira Inoue, Akihiko Homma, Ryuichi Matsuzaki, Gerd K Binnig, Walter Haeberle: Scanning probe microscope and method of measuring geometry of sample surface with scanning probe microscope. Seiko Instruments, International Business Machines Corporation, Adams & Wilks, December 31, 2002: US06499340 (5 worldwide citation)

A measuring method and apparatus of a scanning probe microscope which is easy to initially set caused by exchanging a cantilever. A cantilever is effected of Z rough movement while forcibly vibrating a sample. When a contact pressure of the cantilever against the sample becomes a predetermined magni ...