1
Torsten Jahnke, Michael Richard Haggerty: Method for the operation of a measurement system with a scanning probe microscope and a measurement system. JPK Instruments, Schmeiser Olsen & Watts, February 5, 2013: US08368017 (1 worldwide citation)

The invention relates to a method for operating a measurement system containing a scanning probe microscope, in particular an atomic force microscope, and to a measurement system for examining a measurement sample using a scanning probe microscope and for optically examining said sample. In the meth ...


2
Detlef Knebel, Torsten Jahnke, Olaf Sunwoldt: Apparatus and method for a scanning probe microscope. Smith Patent Office, March 24, 2005: US20050061970-A1

The invention concerns a device and a method for a scanning probe microscope, in particular, an atomic force scanning microscope. The invention is characterized in that it comprises a measuring device (100) including a lateral displacement mechanism (1) for displacing a measuring probe (5) in a plan ...


3
Torsten Jahnke, Michael Richard Haggerty: Method for the Operation of a Measurement System With a Scanning Probe Microscope and a Measurement System. Schmeiser Olsen & Watts, December 18, 2008: US20080308726-A1

The invention relates to a method for operating a measurement system containing a scanning probe microscope, in particular an atomic force microscope, and to a measurement system for examining a measurement sample using a scanning probe microscope and for optically examining said sample. In the meth ...


4
Detlef Knebel, Torsten Jahnke, Olaf Sunwoldt: Apparatus and method for a scanning probe microscope. Smith Patent Office, July 27, 2006: US20060168703-A1

The invention relates to an apparatus and a method for a scanning probe microscope, comprising a measuring assembly which includes a lateral shifting unit to displace a probe in a plane, a vertical shifting unit to displace the probe in a direction perpendicular to the plane, and a specimen support ...


5
Mirko Leuschner, Jens Struckmeier, Ulrich Geisler, Torsten Jahnke: Heat Coupling Device. Nambition, Frost Brown Todd, February 4, 2010: US20100031403-A1

The invention concerns a heat coupling device for scanning force or atomic force microscopy, comprising a first heat conducting device (27), a second heat conducting device (28) and a coupling device (36, 38, 39, 40, 41), in which the first heat conducting device (27) is movable relative to the seco ...


6
Torsten Jahnke: Method for examining a test sample using a scanning probe micrscope, measurement system and a measuring probe system. Jpk Instruments, Schmeiser Olsen & Watts, August 26, 2010: US20100218284-A1

The invention relates to a method and to a device for examining a test sample using a scanning probe microscope. According to the method a first and a second measurement using a scanning probe microscope are carried out on the test sample using a measuring probe system in which a measuring probe and ...


7
Detlef Knebel, Torsten Jahnke: Method and Device for Positioning a Movable Part in a Test System. JPK Instruments, Smith Patent Office, June 4, 2009: US20090140685-A1

The invention relates to a method and a device for the positioning of a displaceable component in an examining system, particularly a measuring or an analytic system wherein, during the process, the displaceable component is displaced with the support of an actuating element coupled to the displacea ...