1
Keith A Frost, Timothy Harns, Ronald D Simmons: Interface system for interfacing a device tester to a device under test. Pacific Western Systems, Harry E Aine, January 3, 1989: US04795977 (46 worldwide citation)

A device tester, such as a memory tester, is electrically interfaced to a device under test, such as a memory die, by means of an improved interface system. The interface system includes an array of coaxial cables for making electrical connection to the test circuits of the device tester by means of ...


2
Timothy Harns: Memory tester having memory repair analysis capability. Pacific Western Systems, Harry E Aine, July 17, 1984: US04460997 (33 worldwide citation)

A memory tester is disclosed for testing a matrix of memory elements, such matrix having spare rows and columns of memory elements to be used for repair of the memory under test. The memory tester tests the memory matrix to derive failure data and stores the failure data in corresponding rows and co ...