1
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, November 9, 2004: US06815963 (65 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.


2
K Reed Gleason, Tim Lesher, Mike Andrews, John Martin: Shielded probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, September 18, 2007: US07271603 (36 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe measurement system preferably includes a probe having a conductive path extending between the first and second surfaces of a membrane and a p ...


3
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, January 9, 2007: US07161363 (36 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.


4
K Reed Gleason, Tim Lesher, Mike Andrews, John Martin: Shielded probe for testing a device under test. Sharp Laboratories of America, Chernoff Vilhauer McClung & Stenzel, June 6, 2006: US07057404 (22 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe measurement system preferably includes a probe having a conductive path between the first and second sides of a substrate and a probe contact ...


5
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Shielded probe for high-frequency testing of a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, December 4, 2007: US07304488 (11 worldwide citation)

A shielded probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe may include a probe tip that extends through a dielectric substrate that supports on a first surface a signal path to test instrumentation and on a sec ...


6
Craig Stewart, Anthony Lord, Jeff Spencer, Terry Burcham, Peter McCann, Rod Jones, John Dunklee, Tim Lesher, David Newton: Chuck for holding a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, February 17, 2009: US07492172 (7 worldwide citation)

A chuck that includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under ...


7
K Reed Gleason, Tim Lesher, Mike Andrews, John Martin: Shielded probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, March 10, 2009: US07501842 (6 worldwide citation)

A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and ...


8
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Shielded probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, April 14, 2009: US07518387 (5 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.


9
K Reed Gleason, Tim Lesher, Mike Andrews, John Martin: Shielded probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, March 3, 2009: US07498829 (5 worldwide citation)

A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and ...


10
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Shielded probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, January 27, 2009: US07482823 (5 worldwide citation)

A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and ...