1
Shivaling S Mahant Shetti, Derek J Smith, Basavaraj I Pawate, George R Doddington, Warren L Bean, Mark G Harward, Thomas J Aton: Distributed processing memory chip with embedded logic having both data memory and broadcast memory. Texas Instruments Incorporated, Jacqueline J Garner, W James Brady III, Richard L Donaldson, May 12, 1998: US05751987 (200 worldwide citation)

Memory chips with data memory (202), embedded logic (206) and broadcast memory (204) for two modes of operation are disclosed. A first mode of operation is the usual memory mode expected of a data RAM. The second mode of operation allows localized computation and/or processing of the data in data me ...


2
Shivaling S Mahant Shetti, Thomas J Aton, Rebecca J Gale: Scanning electron microscope based parametric testing method and apparatus. Texas Instruments Incorporated, Ira S Matsil, B Peter Barndt, Richard L Donaldson, November 3, 1992: US05159752 (116 worldwide citation)

A scanning electron microscope (28) is connected to a test structure (48) formed on a semiconductor wafer. The test structure (48) comprises a plurality of first parallel structures (54) and a plurality of second parallel structure (56) transverse to and interlocking with the first structures (54). ...


3
Theodore W Houston, Robert A Soper, Thomas J Aton: Double pattern and etch of poly with hard mask. Texas Instruments Incorporated, Peter K McLarty, W James Brady III, Frederick J Telecky Jr, September 7, 2004: US06787469 (53 worldwide citation)

A system for fabricating a mixed voltage integrated circuit is disclosed in which a gate is provided that contains a gate oxide and a gate conductor on a substrate. A first mask is deposited to pattern the length of the gate by etching, and a second mask pattern is deposited and used to etch the wid ...


4
Scott D Jantz, Thomas J Aton: Radioisotope power cells. Texas Instruments Incorporated, Douglas A Sorensen, Richard L Donaldson, William E Hiller, March 7, 1995: US05396141 (31 worldwide citation)

An electrical power source or power cell (10) includes a semiconductor material (12) having an N region (14), a P region (16) and a P-N junction (18). A radioactive source (24) associates with P-N junction (18) and emits energy or radioactive particles (26) into semiconductor material (12). In semic ...


5
Thomas J Aton, Satwinder Malhi, Masashi Hashimoto, Shivaling S Mahant Shitti, Oh Kyong Kwon, Thirumalai Sridhar: Method and apparatus for testing passive substrates for integrated circuit mounting. Texas Instruments Incorporated, James C Kesterson, James T Comfort, Melvin Sharp, October 22, 1991: US05059897 (29 worldwide citation)

A system and method for testing the continuity of interconnecting nets on a substrate to be used in multi-chip technology is provided. The system includes coupling a test pad (15) to the net (12) to be tested. The test pad (15) is coupled through a diode (34) to a common node (32). The voltage of a ...


6
Thomas J Aton, Rey M Rincon: Disposable high performance test head. Texas Instruments Incorporated, James C Kesterson, B Peter Barndt, Richard L Donaldson, July 7, 1992: US05128612 (26 worldwide citation)

A disposable integrated circuit test head (34) communicates a plurality of test signals between test nodes (20) of an integrated circuit and test circuitry. Disposable high-density test head (30) comprises signal platform (24) which includes tape layer (24) and interconnection lines (28). Interconne ...


7
Thomas J Aton: On-chip capacitor. Texas Instruments Incorporated, Michael K Skrehot, Frederick J Telecky Jr, Wade James Brady III, October 21, 2003: US06635916 (25 worldwide citation)

An on-chip analog capacitor. Metal interconnect structures are used to form the capacitor, and the interdigitated fingers of like polarity within the interconnect structure are connected above and below to one another by metal vias to form a wall of metal which increases total capacitance by taking ...


8
Thomas J Aton, Phillip Chapados Jr, Jimmy W Hosch, Ajit P Paranjpe: Process control for submicron linewidth measurement. Texas Instruments Incorporated, John C Crane, Richard L Donaldson, November 1, 1994: US05361137 (24 worldwide citation)

A method and apparatus for measuring submicron linewidths, using diffraction gratings. A set of "fixed-linewidth variable-pitchwidth" test gratings has a number of gratings, each grating having the same linewidth but having different pitchwidths. These gratings are illuminated to form diffraction pa ...


9
Thomas J Aton, Robert A Soper: Method and system for mask pattern correction. Texas Instruments Incorporated, W James Brady III, Frederick J Telecky Jr, July 20, 2004: US06764795 (22 worldwide citation)

A method and system for mask pattern correction are disclosed. A portion of a mask pattern is segmented into segments (


10
Thomas J Aton: On-chip capacitor. Texas Instruments Incorporated, Wade James Brady III, Frederick J Telecky Jr, May 24, 2005: US06897505 (21 worldwide citation)

An on-chip analog capacitor. Metal interconnect structures are used to form the capacitor, and the interdigitated fingers of like polarity within the interconnect structure are connected above and below to one another by metal vias to form a wall of metal which increases total capacitance by taking ...