1
Strid Eric W, Jones Keith E: System for setting reference reactance for vector corrected measurements.. Cascade Microtech, September 20, 1989: EP0333521-A1 (87 worldwide citation)

A system is disclosed for calibrating vector corrected electrical measurements to adjust for distortion due to reactance in the measuring circuit, particularly that caused by variable positioning of a circuit element, such as a probe or coupling. Initial error factors for directivity, source match, ...


2
Gleason Reed, Strid Eric W, Flegal Robert T, Mccamant Angus J: Wafer probes.. Tektronix, August 5, 1987: EP0230766-A1 (37 worldwide citation)

A wafer probe comprises a support member having an end region which is shaped to permit the end region to be brought into close proximity with a component under test. An amplifier is mounted on the support member at its end region. A conductive probe element is attached to the amplifier and is elect ...


3
Gleason K Reed, Jones Keith E, Strid Eric W: Microwave wafer probe having replaceable probe tip.. Cascade Microtech, May 9, 1990: EP0367542-A2 (5 worldwide citation)

A microwave wafer probe having a replaceable planar transmission line probe tip (14) which detachably connects to a planar transmission line circuit board (26) within the probe head. The circuit board (26) may include passive and/or active electrical circuit components interconnecting its conductors ...


4
Gleason K Reed, Jones Keith E, Strid Eric W: Overlapped interfaces between coplanar transmission lines which are tolerant to transverse and longitudinal misalignment.. Cascade Microtech, May 9, 1990: EP0367543-A2 (5 worldwide citation)

An interface structure, for connecting a pair of coplanar transmission lines (50, 50a) in end-to-end overlapping relation to each other, employs dissimilarly-shaped overlapping end portions (55, 55a, 54, 54a) of the respective signal and/or ground lines (53, 53a) of the transmission lines (50, 50a). ...


5
Strid Eric W, Davidson Andrew C: Calibration verification and correction method.. Cascade Microtech, June 5, 1991: EP0430475-A2 (2 worldwide citation)

A method for correcting inaccuracies in error factors of an error model used for vector-corrected, microwave-frequency measurements. Verifying de-embedded measurements are compared to known characteristics of at least one verification standard. At least one parameter of the calibration standards, or ...


6
Strid Eric W: Sonde de plaquette, Wafer probe. Cascade Microtech, KIRBY EADES GALE BAKER, July 17, 1990: CA1271848

Abstract A wafer probe for testing semiconductordevices brings low impedance connections closelyadjacent device bonding pads for bypassing powersupply voltages.


7
Gleason K Reed, Mccamant Angus J, Flegal R Timothy, Strid Eric W: Sonde a plaquettes a amplificateur incorpore, Wafer probe with mounted amplifier. Tektronix, KIRBY EADES GALE BAKER, April 4, 1989: CA1252221

Abstract A wafer probe comprises a support member hav-ing an end region which is shaped to permit the endregion to be brought into close proximity with acomponent under test. An amplifier is mounted onthe support member at its end region. A conductiveprobe element is attached to the amplifier and is ...


8
STRID Eric W: SYSTÈMES ET PROCÉDÉS DESTINÉS À UN TRANSFERT DE PUISSANCE ET DE DONNÉES SANS CONTACT DANS DES DISPOSITIFS ÉLECTRONIQUES, SYSTEMS AND METHODS FOR NON-CONTACT POWER AND DATA TRANSFER IN ELECTRONIC DEVICES. CASCADE MICROTECH, STRID Eric W, DASCENZO David S, March 22, 2012: WO/2012/037444

Systems and methods for non-contact and/or wireless transmission of power and/or data between and/or within electronic devices. These systems and methods may include the use of two or more wireless power modules to transmit a wireless power signal between a first electronic device and a second elect ...


9
Campbell Richard, Strid Eric W, Andrews Mike: Differential signal probe with integral balun. Cascade Microtech, Campbell Richard, Strid Eric W, Andrews Mike, RUSSEL Kevin L, December 21, 2007: WO/2007/146285

A probe with integral balun enables connecting a device utilizing differential signals to a source or a sink ended signals.


10
Strid Eric W, Smith Kenneth R, Hayward Roger: Calibration technique. Cascade Microtech, Strid Eric W, Smith Kenneth R, Hayward Roger, Russell Kevin L, December 17, 2009: WO/2009/151648

The tolerance of Short-Open-Load (SOL) and Short-Open-Load-Reflect (SOLR) VNA calibration for variability in probe position is improved by using load and short calibration structures having impedance elements with a length at least two times the probe contact pitch and a width at least two times the ...