1
Richard Allan Deckert, Steven Engelking, Joey Dean Evans: Integrated testing method and apparatus for semiconductor test operations processing. Sony Corporation, Sony Electronics, Wood Herron & Evans L, October 24, 2000: US06137303 (119 worldwide citation)

A semiconductor wafer testing and inspecting apparatus and method are provided in which a plurality of tests are performed on each of a plurality of wafers from a wafer cassette and before the wafers are returned to a packaging cassette or further processing. A carousel conveyor receives each wafer ...


2
Steven Engelking, Richard Allan Deckert, Joey Dean Evans: Method and apparatus for electrically testing semiconductor devices fabricated on a wafer. Sony Corporation, Sony Electronics, Ronald P Kananen, Rader Fishman & Grauer, July 10, 2001: US06259261 (67 worldwide citation)

A probe head replaces the probe card conventionally used to electrically test circuits on semiconductor wafers. Within the probe head, an array of pins is biased in a retracted position. A corresponding array of leads is biased in an extended position. By clamping a selector card with one or more ap ...


3
Steven Engelking, Carol Magallanez: Clean room cart. Sony Corporation, Sony Electronic, Pasquale Musacchio, Jerry A Miller, February 6, 1996: US05489106 (20 worldwide citation)

A cart for maintaining items, which are used in a cleanroom, at a predetermined cleanliness level. The cart includes a cabinet having an internal cavity and opposed first and second internal walls. The cart further includes a shelf affixed horizontally within the cavity to form top and lower compart ...


4
Steven Engelking: Self-levelling wafer-lot cart. Sony Corporation, Sony Electronics, Ronald P Kananen, February 23, 1999: US05873585 (3 worldwide citation)

In order to transport delicate equipment, unstable/hazardous liquids or the like, from one point to another, a cart, or similar form of conveyance, is provided with one or more tables or platforms which are pivotally supported and connected to a relatively large mass. The mass exhibits sufficient in ...


5
Steven Engelking, Robert R Sanchez: Acid bottle washing apparatus and method. Sony Corporation, Sony Electronics, Ronald P Kananen, December 22, 1998: US05851308 (2 worldwide citation)

In order to quickly and inexpensively rinse recyclable acid bottles which contain acid residues or decontaminate pieces of apparatus which are contaminated with acid, the interior of the bottles or apparatus is rinsed with an alkaline solution and then with water. The exterior of the bottles or appa ...


6
Steven Engelking, Robert R Sanchez: Acid bottle washing apparatus and method. Sony Corporation, Sony Electronics, Ronald P Kananen, February 24, 1998: US05720307 (2 worldwide citation)

In order to quickly and inexpensively rinse recyclable acid bottles which contain acid residues or decontaminate pieces of apparatus which are contaminated with acid, the interior of the bottles or apparatus is rinsed with an alkaline solution and then with water. The exterior of the bottles or appa ...


7
Steven Engelking, Robert R Sanchez: Apparatus and method for neutralizing a contaminated heating element. Sony Corporation, Sony Electronics, Pasquale Musacchio, Jerry A Miller, February 13, 1996: US05491282 (1 worldwide citation)

Apparatus for neutralizing a heating element contaminated with acid. A housing is provided which receives water and a base material. The water and base material combine within the housing to form a neutralizing agent. The neutralizing agent is then passed through the heating element in order to neut ...


8
Steven Engelking, Richard Allan Deckert, Joey Dean Evans: Method and apparatus for polishing electrical probes. Sony Corporation, Sony Electronics, Ronald P Kananen, Rader Fishman & Grauer, March 20, 2001: US06203411

A probe polish burnishing assembly has a stem having a substantially spherical surface. This spherical surface makes intimate contact with the concave surfaces commonly present at the tips of set screws used to align the assembly, decreasing the likelihood of slippage and chipping of the stem. Align ...


9
Steven Engelking, Hien Nguyen: Method and apparatus for cleaning electrical probes. Sony Corporation, Rader Fishman & Grauer Pllc, December 19, 2002: US20020189648-A1

An apparatus and method for cleaning needle probe tips includes a spray nozzle that is shaped to fit in a needle-tip aperture formed by a plurality of needle probes. The spray nozzle includes a plurality of openings through which a fluid can be sprayed onto the probe tips to blast debris off of the ...



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