1
Aleksandar Uzelac, David A Stevens, Weidong Zhao, Takahiro Shigemitsu, Briggs A Willoughby, John Graham Pierce, Pravin Kumar Santiago, Craig S Ranta, Timothy Allen Wright, Jeffrey C Maier, Robert T Perry, Stanimir Naskov Kirilov: Latency measurement. Microsoft Corporation, Tony Azure, Andrew Sanders, Micky Minhas, May 13, 2014: US08725443 (13 worldwide citation)

Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different te ...


2
Aleksandar Uzelac, David A Stevens, Weidong Zhao, Takahiro Shigemitsu, Briggs A Willoughby, John Graham Pierce, Pravin Kumar Santiago, Craig S Ranta, Timothy Allen Wright, Jeffrey C Maier, Robert T Perry, Stanimir Naskov Kirilov, Andrey B Batchvarov: Probabilistic latency modeling. Microsoft Technology Licensing, Timothy Churna, Kate Drakos, Micky Minhas, May 12, 2015: US09030437 (6 worldwide citation)

Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different te ...


3
Aleksandar Uzelac, David A Stevens, Weidong Zhao, Takahiro Shigemitsu, Briggs A Willoughby, John Graham Pierce, Pravin Kumar Santiago, Craig S Ranta, Timothy Allen Wright, Jeffrey C Maier, Robert T Perry, Stanimir Naskov Kirilov, Andrey B Batchvarov: Probabilistic latency modeling. Microsoft Technology Licensing, Timothy Churna, Sergey Lamansky, Micky Minhas, July 19, 2016: US09395845 (3 worldwide citation)

Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different te ...


4
Aleksandar Uzelac, David A Stevens, Weidong Zhao, Takahiro Shigemitsu, Briggs A Willoughby, John Graham Pierce, Pravin Kumar Santiago, Craig S Ranta, Timothy Allen Wright, Jeffrey C Maier, Robert T Perry, Stanimir Naskov Kirilov: Contact geometry tests. MICROSOFT TECHNOLOGY LICENSING, May 8, 2018: US09965094

Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different te ...


5
Aleksandar Uzelac, David A Stevens, Weidong Zhao, Takahiro Shigemitsu, Briggs A Willoughby, John Graham Pierce, Pravin Kumar Santiago, Craig S Ranta, Timothy Allen Wright, Jeffrey C Maier, Robert T Perry, Stanimir Naskov Kirilov, Andrey B Batchvarov: Probabilistic Latency Modeling. Microsoft Corporation, July 26, 2012: US20120188197-A1

Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different te ...


6
Aleksandar Uzelac, David A Stevens, Weidong Zhao, Takahiro Shigemitsu, Briggs A Willoughby, John Graham Pierce, Pravin Kumar Santiago, Craig S Ranta, Timothy Allen Wright, Jeffrey C Maier, Robert T Perry, Stanimir Naskov Kirilov: Contact Geometry Tests. Microsoft Corporation, July 26, 2012: US20120188176-A1

Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different te ...


7
Aleksandar Uzelac, David A Stevens, Weidong Zhao, Takahiro Shigemitsu, Briggs A Willoughby, John Graham Pierce, Pravin Kumar Santiago, Craig S Ranta, Timothy Allen Wright, Jeffrey C Maier, Robert T Perry, Stanimir Naskov Kirilov: Latency Measurement. Microsoft Corporation, July 26, 2012: US20120191394-A1

Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different te ...