1
Kempei Suzuki, Yushi Iwanaga, Hiroshi Sato, Kohei Sato, Noriyuki Igarashi, Shinichi Koya: IC test equipment. Takeda Riken, Staas & Halsey, September 8, 1987: US04691831 (53 worldwide citation)

An IC element supplied to a testing station is guided by a rail and a guide member to move by its own weight. At least one of the rail and guide member has built therein plate-shaped ceramic heater or plate-shaped silicone rubber heater. The guide member urges the IC element against the rail to heat ...


2
Kenpei Suzuki, Shinichi Koya, Hiroshi Sato: Contact drive assembly for use with electronic part test equipment. Takeda Riken Kogyo Kabushikikaisha, Staas & Halsey, January 25, 1983: US04370011 (12 worldwide citation)

In a contact drive assembly for use with test equipment for testing, for example, an IC element, a movable contact piece is brought into contact with a terminal pin of the IC element to connect it to a measuring circuit. A flexible tube is disposed adjacent the movable contact piece and compressed a ...