1
Yoshihiro Ashihara, Isao Nishizono, Hidetaka Minakawa, Masahisa Okada, Yasusuke Sakurabayashi, Fumio Watanabe, Shin ichi Wakana: Automatic immunological measuring system. Fujirebio, Sughrue Mion Zinn Macpeak and Seas, October 27, 1992: US05158895 (120 worldwide citation)

An automatic immunoassay apparatus utilizes cartridges each having at least two wells, a first well containing solid phase material carrying antigen or antibody, and a second well containing antibody or antigen labelled with labelling compound. The wells may be sealed with a suitable sealing film be ...


2
Yoshihiro Ashihara, Isao Nishizono, Hidetaka Minakawa, Masahisa Okada, Yasusuke Sakurabayashi, Fumio Watanabe, Shin ichi Wakana: Automatic immunological measuring system. January 9, 1996: US05482839 (68 worldwide citation)

An automatic immunoassay apparatus utilizes cartridges each having at least two wells, a first well of said wells containing solid phase material carrying antigen or antibody, a second well of said wells containing antibody or antigen labelled with labelling compound. The wells may be sealed with a ...


3
Yoshihiro Ashihara, Isao Nishizono, Hidetaka Minakawa, Masahisa Okada, Yasusuke Sakurabayashi, Fumio Watanabe, Shin ichi Wakana: Method of immunoassay measurement. Fujirebio, Cooper & Dunham, March 1, 1994: US05290708 (24 worldwide citation)

An automatic immunoassay apparatus utilizes cartridges each having at least two wells, a first well containing solid phase material carrying antigen or antibody, and a second well containing antibody or antigen labelled with labelling compound. The wells may be sealed with a suitable sealing film be ...


4
Shin ichi Wakana, Akinori Miyamoto, Soichi Hama, Kazuyuki Ozaki, Toshiaki Nagai: Electrooptic voltage waveform measuring method and apparatus. Fujitsu, Armstrong Westerman Hattori McLeland & Naughton, May 2, 2000: US06057677 (10 worldwide citation)

An electrooptic voltage waveform measuring apparatus, which includes an electrooptic element having an electrooptic effect; a first electrode mounted on the electrooptic element and electrically coupled to an object to be measured; and a first light source irradiating a light on the electrooptic ele ...


5
John A Nees, Shin ichi Wakana: Ultrafast electrical scanning force microscope probe. Regents of the University of Michigan, Fujitsu, Brooks & Kushman, August 15, 1995: US05442300 (7 worldwide citation)

An ultrafast scanning probe with 2.5-picosecond response time and 10-nanometer spatial resolution. In one embodiment, a single probe tip is formed on an input electrode layer which is at least partially formed on a cantilever portion of the probe. The cantilever portion is formed by at least one lay ...


6
Shin ichi Wakana, Akinori Miyamoto, Soichi Hama, Kazuyuki Ozaki, Toshiaki Nagai: Electrooptic voltage waveform measuring method employing light sampling technique using Pockels effect. Fujitsu, Armstrong Westerman Hattori McLeland & Naughton, July 10, 2001: US06259244 (2 worldwide citation)

An electrooptic voltage waveform measuring apparatus, which includes an electrooptic element having an electrooptic effect; a first electrode mounted on the electrooptic element and electrically coupled to an object to be measured; and a first light source irradiating a light on the electrooptic ele ...