1
James M Barton, Shahin Tahmassebi, David Platt: Self-test electronic assembly and test system. Tivo, Michael A Glenn, Kirk Wong, May 7, 2002: US06385739 (66 worldwide citation)

A self-test electronic assembly performs self-testing, such as diagnostic or run-in testing of components and circuits, based upon internally stored test procedures. The results of self-testing are stored internally to the device, providing valuable information regarding the self-test electronic ass ...


2
James M Barton, Shahin Tahmassebi, David Platt: Self-test electronic assembly and test system. TiVo, Michael A Glenn, Kirk D Wong, Glenn Patent Group, November 4, 2003: US06643798 (42 worldwide citation)

A self-test electronic assembly performs self-testing, such as diagnostic or run-in testing of components and circuits, based upon internally stored test procedures. The results of self-testing are stored internally to the device, providing valuable information regarding the self-test electronic ass ...


3
James M Barton, Shahin Tahmassebi, David Platt: Self-test electronic assembly and test system. Glenn Patent Group, July 11, 2002: US20020091966-A1 (1 worldwide citation)

A self-test electronic assembly performs self-testing, such as diagnostic or run-in testing of components and circuits, based upon internally stored test procedures. The results of self-testing are stored internally to the device, providing valuable information regarding the self-test electronic ass ...