1
Frederick I Linker, Michael D Kirk, John D Alexander, Sang il Park, Sung il Park, Ian R Smith: Scanning probe microscope. Park Scientific Instruments, Skjerven Morrill MacPherson Franklin & Friel, December 27, 1994: US05376790 (117 worldwide citation)

A scanning probe microscope having numerous advantages is disclosed. Respective scanning force and scanning tunneling probes are removably mounted in the head using kinematic mounting techniques so that they may be substituted for one another without the need to adjust the cantilever deflection sens ...


2
Sang il Park, Ian R Smith, Michael D Kirk: Large stage system for scanning probe microscopes and other instruments. Park Scientific Instruments, Wilson Sonsini Goodrich & Rosati, September 30, 1997: US05672816 (109 worldwide citation)

A large scale horizontal translation stage for a microscope or other instrument particularly a scanning probe microscope is disclosed. The translation stage is provided with air bearings which allow it to float over a planar surface. The translation stage is kinematically mounted on a guiding member ...


3
John A Rogers, Ralph Nuzzo, Hoon sik Kim, Eric Brueckner, Sang Il Park, Rak Hwan Kim: Printed assemblies of ultrathin, microscale inorganic light emitting diodes for deformable and semitransparent displays. The Board of Trustees of the University of Illinois, Lathrop & Gage, October 21, 2014: US08865489 (90 worldwide citation)

Described herein are printable structures and methods for making, assembling and arranging electronic devices. A number of the methods described herein are useful for assembling electronic devices where one or more device components are embedded in a polymer which is patterned during the embedding p ...


4
Sang Il Park, Frederick I Linker, Ian R Smith: Scanning probe microscope having a single viewing device for on-axis and oblique angle views. Park Scientific Instruments, Wilson Sonsini Goodrich & Rosati, February 3, 1998: US05714756 (79 worldwide citation)

An optical system for a scanning probe microscope provides both an optical on-axis view and an optical oblique view of the sample by two optical paths each providing an image to a CCD camera via an auto-zoom lens. A shutter alternately blocks the image of either view from reaching the auto-zoom lens ...


5
Sang Il Park, Ian R Smith: Scanning probe microscope with scan correction. ThermoMicroscopes, David J Weitz, Wilson Sonsini Goodrich & Rosati, July 24, 2001: US06265718 (64 worldwide citation)

An optical system for a scanning probe microscope provides both an optical on-axis view and an optical oblique view of the sample by means of two optical paths each providing an image to a CCD camera via an auto-zoom lens. A shutter alternately blocks the image of either view from reaching the auto- ...


6
John Rogers, Ralph Nuzzo, Matthew Meitl, Etienne Menard, Alfred J Baca, Michael Motala, Jong Hyun Ahn, Sang Il Park, Chang Jae Yu, Heung Cho Ko, Mark Stoykovich, Jongseung Yoon: Optical systems fabricated by printing-based assembly. The Board of Trustees of the University of Illinois, Semprius, Lathrop & Gage, May 13, 2014: US08722458 (62 worldwide citation)

Provided are optical devices and systems fabricated, at least in part, via printing-based assembly and integration of device components. In specific embodiments the present invention provides light emitting systems, light collecting systems, light sensing systems and photovoltaic systems comprising ...


7
Thomas R Albrecht, Moris Musa Dovek, Michael D Kirk, Sang IL Park: Scanning force microscope having aligning and adjusting means. Park Scientific Instruments, Flehr Hohbach Test Albritton & Herbert, October 20, 1992: US05157251 (42 worldwide citation)

A scanning force microscope having a sensor head and a base wherein a moveable sample holder is housed in the base and is positioned relative to a probe housed in the sensor head, such sample being monitored by an optical deflection detection system. The detection system is configured to provide dir ...


8
Woo Young So, Kyung Jin Yoo, Sang Il Park: Method of manufacturing CMOS thin film transistor. Samsung SDI, Staas & Halsey, June 22, 2004: US06753235 (29 worldwide citation)

A method of manufacturing a CMOS TFT including forming first and second semiconductor layers on an insulating substrate using a first mask, respectively, the substrate having first and second regions, the first semiconductor layer formed on the first region, the second semiconductor layer formed on ...


9
Jaewan Hong, Sang il Park, Zheong Gu Khim: Method and apparatus for measuring mechanical and electrical characteristics of a surface using electrostatic force modulation microscopy which operates in contact mode. PSIA Corporation, David E Steuber, Omkar K Suryadevara, Skjerven Morrill MacPherson Franklin & Friel, February 13, 2001: US06185991 (28 worldwide citation)

A microscope uses electrostatic force modulation microscopy to measure mechanical and electrical characteristics of a sample. A tip contacts the sample while a voltage (which may have dc and ac components) is applied between the tip and sample. The tip oscillates even though the tip is contacting th ...


10
Frederick I Linker, Michael D Kirk, John D Alexander, Sang il Park, Sung il Park, Ian R Smith, Peter R Swift: Scanning probe microscope. March 5, 1996: US05496999 (26 worldwide citation)

A scanning probe microscope having numerous advantages is disclosed. Respective scanning force and scanning tunneling probes are removably mounted in the head using kinematic mounting techniques so that they may be substituted for one another without the need to adjust the cantilever deflection sens ...