1
Ron A Peters: Probe station having environment control chambers with orthogonally flexible lateral wall assembly. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, October 5, 1999: US05963027 (65 worldwide citation)

A probe station for probing a test device has a chuck assembly substantially enclosed by an environment control enclosure and laterally movable relative to such enclosure. The environment control enclosure includes a flexible wall assembly interconnected with the chuck assembly to enable such latera ...


2
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having inner and outer shielding. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, December 14, 1999: US06002263 (57 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


3
Ron A Peters: Probe station having environment control chamber with bendably extensible and retractable lateral wall assembly. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, June 26, 2001: US06252392 (50 worldwide citation)

A probe station for probing a test device has a chuck assembly substantially enclosed by an environment control enclosure and laterally movable relative to such enclosure. The environment control enclosure includes a flexible wall assembly interconnected with the chuck assembly to enable such latera ...


4
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, March 26, 2002: US06362636 (50 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


5
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having inner and outer shielding. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, September 11, 2001: US06288557 (49 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


6
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, October 28, 2003: US06639415 (49 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


7
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, December 3, 2002: US06489789 (49 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


8
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, January 11, 2005: US06842024 (47 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


9
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, December 1, 2009: US07626379 (21 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


10
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, March 13, 2007: US07190181 (8 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...