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Srinath Krishnan, Dong Hyuk Ju, William G En, Siu Lun Lee, Richard K Klein: Device and method for testing performance of silicon structures. Advanced Micro Devices, Renner Otto Boisselle & Sklar, March 18, 2003: US06535015 (2 worldwide citation)

An integrated test circuit for a silicon on insulator circuit structure is formed on the same wafer as the circuit structure. The wafer includes an input circuit coupled to the silicon on insulator circuit structure which generates a drive signal for operating the silicon on insulator circuit struct ...


22
Richard K Klein, Mario M Pelella: Emulation of long delay chain by ring oscillator with floating body-tied body devices. Michelel Liu, Sawyer Law Group, June 10, 2004: US20040108886-A1

A method and apparatus for reducing the number of stages for measuring first and second switching speeds for PD/SOI transistors uses an inverter circuit which includes: a p-channel body-tied transistor; an n-channel body-tied transistor, coupled at their drains and gates; and a first and a second gr ...


23
Mario M Pelella, Amy C Tu, Richard K Klein: Discontinuous nitride structure for non-volatile transistors. Advanced Micro Devices, Winstead Sechrest & Minick P C, December 7, 2004: US06828607

A multiple independent bit Flash memory cell has a gate that includes a first oxide layer, a discontinuous nitride layer on the first oxide layer, a second oxide layer on the discontinuous nitride layer and the first oxide layer, and a polysilicon layer on the second oxide layer. The discontinuous n ...