1
Richard Campbell: Test structure and probe for differential signals. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, July 22, 2008: US07403028 (26 worldwide citation)

A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.


2
James N Thompson, Etienne Marc, Richard Campbell, Richard E Nye: Connector for seismic cable. Fairfield Industries Incorporated, Patterson & Sheridan, April 26, 2011: US07933165 (24 worldwide citation)

A method and apparatus for a seismic cable is described. The apparatus includes a plurality of cable segments comprising at least a first cable segment and a second cable segment coupled by a connector. The connector comprises a cylindrical body having a first diameter, a portion of the body having ...


3
Richard G Campbell III, Richard Campbell Sr: Plug securing and outlet cover device. Kirk A Buhler, Buhler & Associates, June 6, 2006: US07056145 (24 worldwide citation)

A plug securing device that allows improved retention of an electrical cord in an electrical outlet. The plug securing device consists of a replacement electrical outlet cover, and a plug securing device. The plug from a power cord is placed through a slot in the plug securing device, and the plug a ...


4
James N Thompson, Etienne Marc, Richard Campbell, Richard E Nye: Seismic cable with adjustable buoyancy. Fairfield Industries Incorporated, Patterson & Sheridan L, July 24, 2012: US08226328 (19 worldwide citation)

A method and apparatus for a seismic cable is described. In one embodiment, the seismic cable includes a first cable segment and a second cable segment coupled together by a connector. Each cable segment includes an inner jacket defining a hollow core, a braided strength fiber surrounding the inner ...


5
Richard Campbell Foltz, William Harold Gengler, Joseph Christopher Lucas Jr, John Vincent Meegan, Troy Gary Reish, James Michael Rolette Jr: Method and apparatus for resource management for a lan server enterprise. International Business Machine Corporation, David A Mims Jr, April 14, 1998: US05740422 (14 worldwide citation)

A method and architecture for the administration of large cells in an Open System Foundation/Distributed Computing Environment (OSF/DCE). The architecture organizes the Cell Directory Service (CDS) name space of the OSF/DCE to allow a network administrator to easily determine network resources under ...


6
Richard Campbell: Modular truck bed storage apparatus. Grant D Kang, Husch & Eppenberger, October 7, 2003: US06629714 (13 worldwide citation)

The present invention is a modular truck bed storage container which is attachable to a second storage container module to form a single storage system which can span the truck bed and has an upper surface for cargo support that may span the truck bed and in which the upper surface may replicate the ...


7
Bradley W Lockhart, Jason W Toomey, Richard Campbell II, Bruce R Burry, Bradley D Looy: Battery monitor. Tarma, April 26, 2005: US06885307 (10 worldwide citation)

An apparatus and method for monitoring at least one battery. A reference ramp voltage signal is applied to a battery. A difference between a measurement ramp voltage signal output from the battery and the reference signal is compared with a threshold to determine battery condition. The determined ba ...


8
Eric Strid, Richard Campbell: Differential signal probing system. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, July 27, 2010: US07764072 (9 worldwide citation)

A probe measurement system comprises a probe with a linear array of probe tips enabling a single probe to be used when probing a test structure with a differential signal.


9
Richard Campbell: Test structure and probe for differential signals. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, July 6, 2010: US07750652 (7 worldwide citation)

A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.


10
Eric Strid, Richard Campbell: On-wafer test structures for differential signals. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, October 28, 2008: US07443186 (7 worldwide citation)

A test structure for characterizing integrated circuits on a wafer includes a differential cell outputting a differential mode signal in response to a differential mode input signal. The probe pads of the test structure are arrayed linearly enabling placement of the test structure in a saw street be ...