1
George E Alcorn, Raymond W Hamaker, Geoffrey B Stephens: Method for forming dense dry etched multi-level metallurgy with non-overlapped vias. International Business Machines Corporation, John E Hoel, October 23, 1979: US04172004 (30 worldwide citation)

A double level metal interconnection structure and process for making same are disclosed, wherein an etch-stop layer is formed on the first metal layer to prevent over-etching thereof when forming the second level metal line in a via hole in an insulating layer thereover, by means of reactive plasma ...


2
George E Alcorn, Raymond W Hamaker, Geoffrey B Stephens: Dense dry etched multi-level metallurgy with non-overlapped vias. IBM Corporation, John E Hoel, September 15, 1981: US04289834 (23 worldwide citation)

A double level metal interconnection structure and process for making same are disclosed, wherein an etch-stop layer is formed on the first metal layer to prevent over-etching thereof when forming the second level metal line in a via hole in an insulating layer thereover, by means of reactive plasma ...


3
David E De Bar, Raymond W Hamaker, Geoffrey B Stephens: Fabrication method for vertical PNP structure with Schottky barrier diode emitter utilizing ion implantation. IBM Corporation, John E Hoel, November 1, 1983: US04412376 (17 worldwide citation)

A vertical PNP bipolar transistor structure with Schottky Barrier diode emitter is disclosed which simplifies the structure and process steps for combining a complementary PNP in an NPN integrated circuit and improves the speed and density of the vertical PNP. The PNP emitter is formed with a Schott ...


4
Kenneth R Swartzel, Sudalaimuthu G Ganesan, Richard T Kuehn, Raymond W Hamaker, Farid Sadeghi: Thermal memory cell and thermal system evaluation. North Carolina State University, Bell Seltzer Park & Gibson, June 4, 1991: US05021981 (16 worldwide citation)

A method for determining the thermal history of an object is disclosed. The object carries at least two thermal calibration materials having different activation energies. The method comprises: first, exposing an object to a thermal treatment; second, detecting the change in each of the calibration ...


5
Kenneth R Swartzel, Sudalaimuthu G Ganesan, Richard T Kuehn, Raymond W Hamaker, Farid Sadeghi: Thermal memory cell and thermal system evaluation. North Carolina State University, Bell Seltzer Park & Gibson, October 27, 1992: US05159564 (15 worldwide citation)

A method for determining the thermal history of an object is disclosed. The object carries at least two thermal calibration materials having different activation energies. The method comprises: first, exposing an object to a thermal treatment; second, detecting the change in each of the calibration ...


6