1
Vahe Adamian, Peter V Phillips, Patrick J Enquist, J Bradford Cole: Method and apparatus for linear characterization of multi-terminal single-ended or balanced devices. Agilent Technologies, November 25, 2003: US06653848 (91 worldwide citation)

A method and apparatus for characterizing a device under test (“DUT”) calibrates a multiport test set and measures S-parameters [S] of the DUT. The method and apparatus further involves determining elements of a scalar orthogonal matrix [M] corresponding to terminals of the DUT a ...


2
Vahe′ A Adamian, Peter V Phillips, Patrick J Enquist: Method and apparatus for calibrating a multiport test system for measurement of a DUT. Agilent Technologies, June L Bouscaren, July 19, 2005: US06920407 (90 worldwide citation)

A method and apparatus for measuring a multiport device using a multiport test set connects one port of the multiport device to a stimulus signal and terminates all remaining ports in a respective load. A response to a stimulus signal is measured on all ports of the multiport device and the measured ...


3
Vahe A Adamian, Michael T Falcinelli, Peter V Phillips: Electronic microwave calibration device. ATN Microwave, Wolf Greenfield & Sacks, July 18, 1995: US05434511 (28 worldwide citation)

An electronic microwave calibration device provides an electronic load connected to each of two ports of a vector network analyzer. The load comprises a plurality of PIN diodes interconnected by transmission line. Each of the diodes are biased to generate different loads or conditions at each of the ...


4
Vahe A Adamian, Michael T Falcinelli, Peter V Phillips: Electronic calibration method and apparatus. ATN Microwave, Wolf Greenfield & Sacks P C, September 3, 1996: US05552714 (27 worldwide citation)

A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devi ...


5
Vahe A Adamian, Peter V Phillips: Programmable broadband electronic tuner. Automatic Testing and Networking, Wolf Greenfield & Sacks, July 23, 1991: US05034708 (25 worldwide citation)

A programmable microwave network test device is capable of establishing a multitude of reflection and transmission coefficients determined by a set of digital inputs. The programmable network enables the collection of groups of measurements which are used to characterize a non-linear or linear devic ...


6
Vahe A Adamian, Michael T Falcinelli, Peter V Phillips: Calibration method and apparatus. ATN Microwave, Wolf Greenfield & Sacks, November 14, 1995: US05467021 (21 worldwide citation)

A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devi ...


7
Vahe A Adamian, Michael T Falcinelli, Peter V Phillips: Electronic calibration method and apparatus. ATN Microwave, Wolf Greenfield & Sacks P C, August 20, 1996: US05548221 (16 worldwide citation)

A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devi ...


8
Vahe′ A Adamian, Peter V Phillips, Patrick J Enquist: Method and apparatus for calibrating a multiport test system for measurement of a DUT. Agilent Technologies, November 30, 2004: US06826506 (14 worldwide citation)

According to one embodiment of the invention, there is provided a method of calibrating an N-port multiport test system for measurement of a DUT. The method consists of coupling each port of an N-port automatic calibration device to a respective port of the N-port multiport test system, and presenti ...


9
Vahe A Adamian, Michael T Falcinelli, Peter V Phillips: Electronic calibration method and apparatus. ATN Microwave, Wolf Greenfield & Sacks, July 16, 1996: US05537046 (12 worldwide citation)

A multistate electronic transfer standard provides electronic conditions to at least one of two ports of a vector network analyzer. One embodiment of the multistate electronic transfer standard includes a plurality of semiconductor interconnected by transmission lines. Each of the semiconductor devi ...


10
Vahe apos A Adamian, Peter V Phillips, Patrick J Enquist: Method and apparatus for calibrating a multiport test system for measurement of a dut. Agilent Technologies, Legal Department, September 18, 2003: US20030173978-A1 (1 worldwide citation)

According to one embodiment of the invention, there is provided a method of calibrating an N-port multiport test system for measurement of a DUT. The method consists of coupling each port of an N-port automatic calibration device to a respective port of the N-port multiport test system, and presenti ...