1
Vahe Adamian, Peter V Phillips, Patrick J Enquist, J Bradford Cole: Method and apparatus for linear characterization of multi-terminal single-ended or balanced devices. Agilent Technologies, November 25, 2003: US06653848 (91 worldwide citation)

A method and apparatus for characterizing a device under test (“DUT”) calibrates a multiport test set and measures S-parameters [S] of the DUT. The method and apparatus further involves determining elements of a scalar orthogonal matrix [M] corresponding to terminals of the DUT a ...


2
Vahe′ A Adamian, Peter V Phillips, Patrick J Enquist: Method and apparatus for calibrating a multiport test system for measurement of a DUT. Agilent Technologies, June L Bouscaren, July 19, 2005: US06920407 (90 worldwide citation)

A method and apparatus for measuring a multiport device using a multiport test set connects one port of the multiport device to a stimulus signal and terminates all remaining ports in a respective load. A response to a stimulus signal is measured on all ports of the multiport device and the measured ...


3
Vahe′ A Adamian, Peter V Phillips, Patrick J Enquist: Method and apparatus for calibrating a multiport test system for measurement of a DUT. Agilent Technologies, November 30, 2004: US06826506 (14 worldwide citation)

According to one embodiment of the invention, there is provided a method of calibrating an N-port multiport test system for measurement of a DUT. The method consists of coupling each port of an N-port automatic calibration device to a respective port of the N-port multiport test system, and presenti ...


4
Vahe apos A Adamian, Peter V Phillips, Patrick J Enquist: Method and apparatus for calibrating a multiport test system for measurement of a dut. Agilent Technologies, Legal Department, September 18, 2003: US20030173978-A1 (1 worldwide citation)

According to one embodiment of the invention, there is provided a method of calibrating an N-port multiport test system for measurement of a DUT. The method consists of coupling each port of an N-port automatic calibration device to a respective port of the N-port multiport test system, and presenti ...


5
Vahe A Adamian, Peter V Phillips, Patrick J Enquist: Method and apparatus for calibrating a multiport test system for measurement of a DUT. Agilent Technologies, Legal Department DL429, September 30, 2004: US20040193382-A1

A method and apparatus for measuring a multiport device using a multiport test set connects one port of the multiport device to a stimulus signal and terminates all remaining ports in a respective load. A response to a stimulus signal is measured on all ports of the multiport device and the measured ...


6
Vahe Adamian, Peter Phillips, Patrick J Enquist, J Bradford Cole: Method and apparatus for linear characterization of multi-terminal single-ended or balanced devices. Agilent Technologies, Legal Department DL429, May 9, 2002: US20020053899-A1

One embodiment of the invention comprises a multiport test set that characterizes a multiterminal DUT. The multiport test set comprises a plurality of ports, a signal generator that provides a test signal over a frequency range, a reference receiver coupled to the signal generator that measures the ...